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Structure and Infrared Emissivity Properties of the MAO Coatings Formed on TC4 Alloys in K2ZrF6-Based Solution

机译:TC4合金在K2ZrF6基溶液中形成的MAO涂层的结构和红外发射率特性

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摘要

Micro-arc oxidation (MAO) ceramic coatings were formed on TC4 alloy surface in silicate and metaphosphate electrolytes based with K2ZrF6 for various concentrations. X-ray diffraction (XRD), Scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) were used to characterize the phase composition, microstructure and chemical compositions of the coatings. The infrared emissivity of the coatings was measured at 50 °C in a wavelength range of 8–20 µm. The microstructural observations all revealed the typical porousstructures. Moreover, adecline in roughness and thickness of the prepared coatings can be observed when the concentration of K2ZrF6 increases. Combined with the results of XRD and XPS, it was found that all the oxides existed as the amorphous form in the coatings except the TiO2 phase. The coatings exhibited the highest infrared emissivity value (about 0.89) when the concentration of K2ZrF6 was 6 g/L, which was possibly attributed to the defect microstructure and the optimal role of ZrO2.
机译:在基于K2ZrF6的各种浓度的硅酸盐和偏磷酸盐电解质中,TC4合金表面上形成了微弧氧化(MAO)陶瓷涂层。 X射线衍射(XRD),扫描电子显微镜(SEM),X射线光电子能谱(XPS)用于表征涂层的相组成,微观结构和化学组成。涂层的红外发射率是在50°C和8-20 µm的波长范围内测量的。显微组织观察均揭示了典型的多孔结构。此外,当K 2 ZrF 6的浓度增加时,可以观察到制备的涂层的粗糙度和厚度的下降。结合XRD和XPS的结果,发现除了TiO2相以外,所有氧化物均以非晶态形式存在于涂层中。当K2ZrF6的浓度为6 g / L时,涂层表现出最高的红外发射率值(约0.89),这可能归因于缺陷的微观结构和ZrO2的最佳作用。

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