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Low-Temperature and Solution-Processable Zinc OxideTransistors for Transparent Electronics

机译:低温和溶液可加工氧化锌透明电子晶体管

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摘要

Zinc oxide (ZnO) thin-film transistors (TFTs) have many promising applications in the areas of logic circuits, displays, ultraviolet detectors, and biosensors due to their high performances, facile fabrication processing, and low cost. The solution method is an important technique for low-cost and large fabrication of oxide semiconductor TFTs. However, a key challenge of solution-processable ZnO TFTs is the relatively high processing temperature (≥500 °C) for achieving high carrier mobility. Here, facile, low-cost, and solution-processable ZnO TFTs were fabricated under the annealing temperature of ≤300 °C. Dense and polycrystalline ZnO films were deposited by the spin-coating method. The ZnO TFTs showed the maximum electron mobility of 11 cm2/V s and a high on/off ratio of >107 when the ZnO thin films were annealed at 300 °C. The mobility was extremely high among solution-processable undoped ZnO TFTs reported previously, even better than some high-cost indium-doped ZnO TFTs fabricated at low temperature. Furthermore, it is found that the mechanism of oxygen vacancies dominates the electron transport in ZnO thin filmand interface behaviors of ZnO thin film and SiO2 gateinsulator, and then dominates the performances of devices.
机译:氧化锌(ZnO)薄膜晶体管(TFT)由于其高性能,便捷的制造工艺和低成本而在逻辑电路,显示器,紫外线检测器和生物传感器领域具有许多有希望的应用。该解决方法是用于氧化物半导体TFT的低成本且大量制造的重要技术。然而,可溶液处理的ZnO TFT的关键挑战是实现较高载流子迁移率的相对较高的处理温度(≥500°C)。在此,在≤300°C的退火温度下制造了价格低廉且可溶液加工的ZnO TFT。通过旋涂法沉积致密和多晶的ZnO薄膜。 ZnO薄膜在300°退火时,其最大电子迁移率为11 cm 2 / V s,开/关比> 10 7 C。在先前报道的可溶液处理的未掺杂ZnO TFT中,迁移率极高,甚至优于在低温下制造的某些高成本铟掺杂ZnO TFT。此外,发现氧空位的机理主导了ZnO薄膜中的电子传输。薄膜和SiO2栅极的介电常数和界面行为绝缘体,然后支配器件的性能。

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