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Thickness-Dependent Swelling Behavior of Vapor-DepositedSmart Polymer Thin Films

机译:气相沉积的厚度依赖性膨胀行为智能聚合物薄膜

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摘要

In this contribution, the temperature-dependent swelling behavior of vapor-deposited smart polymer thin films is shown to depend on cross-linking and deposited film thickness. Smart polymers find application in sensor and actuator setups and are mostly fabricated on delicate substrates with complex nanostructures that need to be conformally coated. As initiated chemical vapor deposition (iCVD) meets these specific requirements, the present work concentrates on temperature-dependent swelling behavior of iCVD poly(N-isopropylacrylamide) thin films. The transition between swollen and shrunken state and the corresponding lower critical solution temperature (LCST) was investigated by spectroscopic ellipsometry in water. The films’ density in the dry state evaluated from X-ray reflectivity could be successfully correlated to the position of the LCST in water and was found to vary between 1.1 and 1.3 g/cm3 in the thickness range 30–330 nm. This work emphasizes the importance of insights in both the deposition process and mechanisms during swelling of smart polymeric structures.
机译:在该贡献中,显示了气相沉积的智能聚合物薄膜的温度依赖性膨胀行为取决于交联和沉积的膜厚度。智能聚合物可用于传感器和执行器装置中,并且通常在具有复杂纳米结构且需要保形涂层的精密基板上制造。当引发的化学气相沉积(iCVD)满足这些特定要求时,本工作着重于iCVD聚(N-异丙基丙烯酰胺)薄膜的温度依赖性膨胀行为。通过光谱椭偏法在水中研究了溶胀和收缩状态与相应的下临界溶液温度(LCST)之间的过渡。通过X射线反射率评估,干燥状态下的薄膜密度可以成功地与LCST在水中的位置相关,并且发现其厚度范围在1.1至1.3 g / cm 3 之间30-330 nm。这项工作强调了智能聚合物结构溶胀过程中洞察沉积过程和机理的重要性。

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