根据 Hiroshi Suzuki 等人提出的单晶残余应力测量方法，测量同一晶面族不同晶面法线对应φ、ψ角度及其衍射峰位2θn ，建立方程组，采用线性回归的方法得出坐标系转化矩阵，并计算出试样坐标系下应力矩阵，避免了 d0测量精度的影响，并利用 IXRD 应力分析仪将此方法成功应用于镍基高温定向结晶叶片残余应力测定，为定向结晶叶片的工艺参数优化提供了有力的技术手段。%According to the single crystal residual stress measurement proposed by Hiroshi Suzuki et al ., the measurement for φ ,ψ and the diffraction peak position 2θn corresponding to different crystal face normal line of the same crystal face group were performed .After the equation group was established ,the coordinate transformation matrix was obtained by using linear regression method , and the stress matrix of sample coordinates was calculated , to avoid d0 measuring precision being affected . This method was successfully applied to measure residual stress of nickel‐base directionally crystallized superalloy blade using the IXRD stress analyzer , and a powerful technical means for the process parameter optimization of directional crystallization blade was provided .
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