扫描电镜在织物、纱线色差分析中的应用

摘要

This paper discussed a new method for analyzing the cause of fabric and yarn with color defect by scanning electron microscope.We found that the numerous cause of color defect on fabric were fabric structure density and the quality of yarn and fiber by analyzing fabric and yarn texture.This method had the advantage of fast and accurate and it could fully satisfy the need of manufacture and distribution.%介绍了一种使用扫描电子显微镜分析织物色差原因的方法,通过对织物结构、纱线质量进行形貌分析,发现织物密度、纱线质量以及并丝、僵丝、断头、未牵伸丝等纤维疵点是织物产生色差的原因。结果表明,该方法具有快速、便捷、准确的优点,可以完全满足生产、营销的技术需要。