首页> 中文期刊> 《高分子科学:英文版》 >CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

         

摘要

In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C1s there is a photoelectron peak at 289.0 eV that appears to be C1s of-(?)-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

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