采用能量色散X射线荧光仪测定分子筛中硫酸根离子的含量

摘要

The analysis method to determine SO42-content in zeolite by energy-dispersive X-ray fluorescence spectrometer was established,and the accuracy and precision of the method were investigated.The results showed that under the condition of air medium,operating voltage 6 kV,electric current 200 A,counting time 180 s,minimum ROI 2.198,maximum ROI 2.433,the linear correlation coefficient of working curve was 0.999 3,the accuracy (absolute error)of the method ranged from 0.01％to 0.14％,its average value was 0.03％ for determining 20 industrial zeolite samples with SO42-mass fraction from O.13％ to 1.50％,and the precision (relative standard deviation) ranged between 0.41％ and 2.94％ when 8 standard samples with SO42-mass fraction from 0.158％ to 3.321％ were repeatedly tested 8 times respectively.%建立了采用能量色散X射线荧光仪测定分子筛中硫酸根离子含量的分析方法,考察了所建方法的准确度和精密度.结果表明,在测试介质为空气,工作电压为6 kV,工作电流为200 μA,计数时间为180 s,最小ROI为2.198,最大ROI为2.433的测试条件下,工作曲线的线性相关系数为0.999 3；测定20个w(SO42-)为0.13％ ～ 1.50％的工业分子筛样品,方法的准确度(绝对误差)为0.01％ ～0.14％,平均值为0.03％；测定8个w(SO42-)为0.158％～3.321％的标准试样,每个样品测试10次,方法的精密度(相对标准偏差)为0.41％～2.94％.