首页> 中文期刊> 《光学仪器》 >基于像散原理的并行共焦检测的微形貌参数的可视化测量

基于像散原理的并行共焦检测的微形貌参数的可视化测量

             

摘要

To achieve accurate measurement of surface profile parameters on the microstructure, the three-dimensional information of the microstructure surface is obtained and the visualization measurement of the microstructure surface parameters is achieved in a parallel confocal system based on the astigmatism method. Combined with the characteristics of the microstructure surface, the cumulative chord length bicubic-spline interpolation curve surface fitting method is used to reconstruct the microstructure surface. High subdivision accuracy is selected to obtained the 3-D surface profiles reconstructed. The 3-D surface profile parameters are evaluated based on the points picked from the cumulative chord length bicubic-spline interpolation curve surface rather than from the local triangular plane in the 3-D surface profile. Analog reconstruction theory of surface data results show that the cumulative chord length bicubic spline reconstruction of micro-structured surface can effectively achieve the accurate measurement of the microstructure surface parameters.%为实现对微结构表面轮廓参数的精确测量,用基于像散原理的并行共焦检测系统获取微结构表面的三维信息,进而实现对微结构表面参数的可视化测量.考虑到微结构表面特点,采用累加弦长双三次样条插值曲面对其表面进行重构.并选择高的插值细分倍率获得连续光顺廓形表面,通过拾取拟合曲面上的点而不是廓形局部三角面片上的点实现三维廓形参数评定.由重构曲面模拟结果显示:累加弦长双三次样条重构微结构表面可以有效地实现对微结构表面参数的精确测量.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号