IGBT高压串联组件的失效检测与恢复策略

摘要

Aiming at the faults of power electronic equipment caused by the failure IGBT in a series connected IGBT stack, the strategy of failure IGBT detection and series stack restart is proposed. The failure mechanism is analyzed from the internal structure of semiconductor device, and the open circuit failure IGBT in the series IGBT stack is diagnosed and located based on the feedback signal from IGBT' s gate driving circuit, and then the stack with the failure IGBT is restarted by closing the bypass-switch paralleled with the failure IGBT during the period the stack is blocked. The experimental system of the series IGBT stack is established, and the results show that the failure IGBT can be identified effectively, and the normal switching patterns of the series IGBT stack can be resumed promptly and reliably.%针对IGBT串联组件中失效器件导致整个装置异常的问题,提出了一种IGBT器件开路失效的检测方法与组件功能恢复策略.从IGBT的内部结构分析了器件失效机理,借助于IGBT驱动电路监测组件中各个IGBT的状态,根据状态反馈对IGBT器件的开路失效故障进行诊断和定位,针对IGBT的开路失效故障,设计了在串联组件阻断后吸合相应旁路开关以恢复组件功能的重启动策略.建立了串联组件中IGBT失效监控实验系统.实验结果表明该系统能准确识别组件内失效的IGBT器件,并及时可靠地恢复了IGBT串联组件的正常开关功能.