电容近炸引信高频部件储存性能试验研究

摘要

This paper carried out storage performance test on fuze high-frequency components of actual unsealed storage for 2, 4, 6 ～ 12 years. The results show that there are two phenomena of high frequency component failure, such as peaking and lowering of oscillating voltage and failure of detection voltage.Failure occurred from the sixth year of storage, and 4, 5, 7, 10, 7, 6, and 10 failures were stored for 6 to 12 years. The mean value of peak value of oscillating voltage and detection voltage have a downward trend, but the oscillation frequency and the saturation detection voltage have not failed.%对实际非密封储存2、4、6～12年的引信高频部件进行储存性能检测试验, 结果表明, 高频部件失效存在振荡电压峰峰值降低失效和检波电压降低失效两种;从储存第6年开始出现失效, 储存6～12年分别失效4、5、7、10、7、6、10发;振荡电压峰峰值和检波电压均值均有下降趋势, 但振荡频率和饱和检波电压未失效.