The high-energy gamma-ray irradiation treatment using Co-60 isotope offers the possibility of engineering mechanical and optoelectronic properties of In Bi0.8Te0.2crystals. Tellurium-doped indium bismuthide(In Bi) crystals were prepared by horizontal directional freezing technique. Dose-dependent modifications in structure, composition and surface topographical features have been analyzed by X-ray powder diffraction, X-ray energy-dispersive analysis, transmission electron and atomic force microscopy, respectively. Dielectric constant and dielectric loss were found to increase with the cumulative dose of radiation, and a shift in the ferroelectric transition temperature(Tc) from 405 to 410 K was observed for25 k Gy. Upon irradiation, there is an enhancement in microhardness(HV), yield stress(ry) and stiffness constant(C11).The optical transmittance was decreased by 12.45%, resulting in a reduction in the optical band gap from 0.210 e V to0.198 e V. These results indicate the suitability of In Bi0.8Sb0.2crystals for low-wavelength infrared applications.
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