淬火和退火后尼龙6的X射线衍射谱

摘要

Nylon 6 films were prepared by means of quenching after isothermal crystallization and annealing. The crystallization behavior of the nylon 6 films was investigated via X-ray diffraction. When the temperature was higher than 443 K isothermal crystallization and the temperature was higher than 473 K for annealing of nylon 6, a high temperature crystallization peak appears at 20 =28. 5°. The intensity of high temperature crystallization peak depends on the thermal history of the film. If the films were cooled in air after isothermal crystallization and annealing, no high temperature crystallization peak exists. The possible causes of the high temperature crystallization peak were analyzed based on the experiment results.%采用X射线衍射研究尼龙6等温结晶后淬火和退火的结晶行为,并根据实验结果分析了高温结晶峰产生的原因.结果表明:在温度高于443 K等温结晶和温度高于473 K退火的尼龙6中,在2θ =28.5°处出现一个高温结晶衍射峰；高温结晶峰的强度与尼龙6薄膜的热历史有关,若尼龙6在等温结晶和退火后空冷,则无高温结晶峰存在.