大型电子系统紧缩试验方法研究

摘要

The large-scale system sampling principle, the re~ucea systctu ~.-~, reliability index computation method are studied in this paper. After that, a new reduced system experi- ment method is proposed which based on the small sampling experiment for large-scale electronics system. This method used the multiple regression analysis of the least square method, therefore the correla- tion between the performance and reliabihty indexes of the reduced system and large-scale system is got. Finally, according to a case study, this experiment method is proven to be effective to solve the reliability test experiment for large-scale electronics system.%通过对大型电子系统的抽样原理，紧缩试验方法，可靠性指标计算方法的研究，提出一种新型的基于大型电子系统小型化抽样试验的紧缩系统试验方法，采用最小二乘估计法中的多元回归分析法，得出紧缩系统与大型系统的性能、可靠性指标相关性。经验证试验证明，该试验方法是解决大型电子系统的可靠性验证试验的有效方法。