大型电子系统与其紧缩系统可靠性的相关性研究

摘要

The reliability index correlation between the large-scale electronic system and it's reduced system are studied.The reliability index of the function redundancy system has been qualitative and quantitative analyzed.The correlation equation of the relationship model is also been established by mathematical educe.Finally,the relationship figure between the system failure rate and the quantity of examination sample is established by example analysis and engineering calculation,as well as using the least square method to estimate and confirm the correlation coefficient γ between the large-scale electronic system and it's reduced system.%研究了大型电子系统与其紧缩系统可靠性指标之间相关关系。对功能冗余系统可靠性指标进行定性定量分析论证,经数学推导建立了二者之间的关系模型,得出相关方程。通过实例分析和工程计算,得到系统失效率与抽样试验样本量的关系图。应用最小二乘估计法估计紧缩系统与总体系统之间的相关系数,确定了大型电子系统与其紧缩系统之间的相关关系。