MULTIPLE IONIZATION PROCESS STUDIED WITH COINCIDENCE TECHNIQUE BETWEEN SLOW RECOIL ION AND PROJECTILE ION IN 42 MeV Arq＋—Ar COLLISIONS

摘要

Slow Ar recoil ion Production cross sections by 42 MeV Ar1+(q=4-14) projectiles were measured using a projectile ion-recoilion coincidence technique in order to provide information on mechanisms of multiple ionization of target atome through pure ionization as well as of that accompaied simultaneously with multiple electron loss or capture of projectiles.The present results suggest that inner-shell electron processes caused through electron transfer into projectiles and also electron ionization by projectiles play a key role in the production of multiply charged recoil ions.