湿热环境对PbS光导探测器可靠性影响

摘要

叙述了PbS薄膜的化学水浴制备方法及PbS薄膜形貌、性能测试及湿热环境（相对湿度95%）试验的过程，阐述了PbS探测器芯片经湿热环境试验后暗阻等性能参数的变化情况，分析了其原因和相关机理。短时间（1 h）内湿热环境下，其性能参数变化在5%以内，在持续24 h的潮湿环境后，PbS的暗阻增大50%以上。在之后的2×24 h、3×24 h、4×24 h、5×24 h湿热环境下，暗阻值增量随时间递增呈正比例关系。当潮湿试验进行到7×24 h后，部分试验样件无法测试出响应信号，样件失效。%The PbS films have been prepared by CMD, and the surface morphology of which is showed, performance and experiment in hydrothermal environment (50±2℃, relative humidity≥95%) are specified. The performances of PbS photoconductive detectors in hydrothermal environment are analysed, which have not been influenced in hydrothermal environment for 1h. The Rd has increased by 50% in hydrothermal environment for 24h, and the average increment of PbS detector is in direct proportion to the time of hydrothermal environment after 2×24h、3×24h、4×24h、5×24h. Some samples have been failed after 7×24h in hydrothermal environment .