基于MARS系统的X射线能谱K-edge特性CT成像技术

摘要

针对传统的 X射线CT系统因采用积分探测器难于鉴别材质的关键技术问题,基于 MARS系统的 X射线能谱CT,开展了 X射线能谱K-edge特性的CT成像技术研究。通过对单一材质和混(复)合材质组成的物理模型的多个 X射线能量段进行CT断层扫描,获得了材质的 K-edge 特性曲线,以此重建出了材质的CT图像。借助材质 K-edge特性的 CT断层图像,可以进行材质的鉴别分析或进行更多的材质认知信息的分析研究。与传统的 X射线CT技术相比较,它可以提供更为丰富的 X射线衰减信息。%The typical conventional CT system employs the digital integrating sensor,for which it is difficult to identify at-tenuation characteristics of different energy X-ray.This paper focuses on X-ray spectral imaging technology based on MARS X-ray spectral CT system.We scanned some singular element materials and a multi-material phantom with different energy X-ray bins,obtained some material K-edge characteristic curves,and reconstructed CT images of multi-material phantom.By means of CT images based on material K-edge characteristics,we can discriminate different materials or recognize more attenuation infor-mation of different materials.Compared to conventional X-ray CT technology,X-ray spectral CT can provide much richer attenu-ation information.