金属化薄膜电容器电容量衰减的解决方案

摘要

针对抑制电磁干扰和降压用金属化薄膜电容器工作一段时间后容量不正常衰减的问题,通过样品解剖和理论分析,收集不同试验条件下的数据,发现金属化薄膜层间空气和封装方式导致容量不正常衰减.将热聚合温度从85℃提高到120℃,选用高温环氧树脂封装,可使所制金属化薄膜电容器在使用过程中电容量衰减小于1％,保证了电子产品在寿命周期内的正常工作.%Capacitance fall-off was observed after working some time in metallizd film capacitors for reducingelectromagnetic interference and voltage. The cause to the capacitance decay of capacitors is packaging mode and the air in its layers through gathering the testing reports, analyzing with theory and improving the instructions. A high temperature epoxy resin coating and enveloping method for metallized film capacitors are applied, The thermal polymerization temperature increases from 85 ℃ to 120 ℃ and the capacitance decay is less than 1% in the process of using, which ensure a good work state in its life cycle of electronic products.