Oxidation of Alloy 690 TT samples either manually ground to 400 and 1500 grit, mechanically polished, or electropolished was performed in a solution of 1500 10 6B and 2.3 10 6Li with 2.5 10 6dissolved H2, at 325℃ and 15.6 MPa for 60 days. The oxide films grown on samples with different surface states were analyzed using various techniques. Results show that a triple-layered structure was formed after immersion: an outermost layer with large scattered oxide particles rich in Fe and Ni, an intermediate layer with small compact oxide particles rich in Cr and Fe for the ground surfaces and loose needle-like oxides rich in Ni for the polished surfaces, and an inner layer with continuous Cr-rich oxides. The surface state was found to affect not only the surface morphology, but also the corrosion rate. Grinding accelerated the growth of protective oxide films such that the ground samples showed a lower oxidation rate than the polished ones.Samples of ground Alloy 690 TT showed superior resistance to intergranular attack(IGA).
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机译:利用扫描穿隧显微镜探讨在硒化铟上未氧化表面和氧化表面之介面接合处的电子特性 =Scanning Tunneling Microscope study of InSe Surface Electronic Properties at the Fresh/Oxided Interface Junction