基于FSM的可编程集成芯片功能测试

摘要

For PCB testing requirements of Missile Electronic Equipment, using a programmable logic device FPGA, the functional testing program is proposed based on FSM. A programmable timer counter Cμ8254 testing as a example, using hardware description language Verilog HDL completed the design and functional simulation of the Finite State Machine. Experiments completed work on three of Cμ8254 functional tests. Experimental results show that the program can complete programmable integrated chip functional testing, and shorten the development cycle, reduce size, has high practical value.%针对某型导弹电子设备电路板测试要求,采用可编程逻辑器件FPGA,提出了一种基于有限状态机(FSM,Finite State Machine)的可编程集成芯片功能测试的方案;以可编程定时计数器Cμ8254的功能测试为例,采用硬件描述语言Verilog HDL完成了FSM的设计和功能仿真,通过实验完成了对Cμ8254其中3种工作方式的功能测试,实验结果表明该方案能完成可编程集成芯片的功能测试;和其它方法相比,简化了设计,同时缩短了开发周期,减小了体积,有较高的实用价值.