Polyether sulfone (PES) films were made by spin-coating PES solutions and solution casting on the silicon wafer. The effect of film thicknesses on the physical aging behavior of PES films was tracked by using oxygen permeability measurements. The PEG films were subjected to isothermal aging at 45, 55, 65 ℃ for more than 400 days. The experimental results show that the thin films is noted for greatly accelerated physical aging compared to the thick films of the same polymer, and the higher the physical aging temperature, the more rapidly the physical aging rate can be observed during physical aging. One ordered phase microstructure can form dur-ing physical aging for PES film with 50 nm thickness while the film with 50 μm thickness has no obvious ordered structure.% 要: 采用旋涂法及浇铸法制备了不同厚度的聚醚砜(PES)薄膜。通过测定薄膜对氧气的透过率研究薄膜厚度对 PES 物理老化性能的影响;控制薄膜的物理老化温度分别为45,55,65 ℃,时间超过400天。结果表明:膜越薄、物理老化温度越高,则 PES 的老化速度越快。采用透射电子显微镜观察发现:50 nm 厚的 PES 薄膜在65 ℃ 物理老化过程中可形成某种局部有序的凝聚态结构;而50 μm 厚的 PES 薄膜没有明显的局部有序结构。
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