反射式NEA GaN光电阴极量子效率恢复研究

摘要

以反射式NEA GaN光电阴极充分激活、衰减以及补Cs后的量子效率曲线为依据,针对阴极量子效率的衰减规律和补C8后的恢复状况,论述了NEA GaN光电阴极量子效率的衰减和恢复机理.经过重新Cs化处理,反射式NEA GaN光电阴极量子效率在240 nm到300 nm的短波区域恢复到激活后最好状态的94%以上,300 nm到375nm的长波区域恢复到88%以上.结合反射式NEA GaN光电阴极衰减前后的表面势垒形状和反射式GaN光电阴极量子效率的计算公式,得到了量子效率曲线的衰减规律以及补Cs后的恢复状况与表面势垒形状改变之间的关系.%In order to investigate the decay tendency and the recovery status of the quantum efficiency of reflection-mode NEA GaN photocathode, the quantum efficiency curves have been studied after the photocathode was fully activated, stored in system and supplemented with Cs.The quantum efficiency decay and recovery processes of reflection-mode NEA GaN photocathode were observed and the mechanism was discussed.The quantum efficiency value of reflection-mode NEA GaN photocathode can be recovered up to more than 94％ of the best value in the shortwave region between 240nm and 300nm,and more than 88％ in the long wave region between 300nm and 375nm after Cs supplement.Based on the changes of surface potential barrier profiles of the reflection-mode NEA GaN photocathode before and after the quantum efficiency degradation and the quantum yield formula, the decay characteristic and the recovery status of quantum efficiency curve after supplement with Cs have been related to the changes of surface barrier shapes.