首页> 中文期刊>物理学报 >双能X射线光栅相衬成像的研究

双能X射线光栅相衬成像的研究

     

摘要

There exist some problems in a grating-based X-ray differential phase contrast imaging system,such as complex imaging system,low imaging efficiency and high requirements for step precision.The phase information extraction method of imaging system has been developed into an existing two-stepping phase shift method from the original phase stepping method,which improves the imaging efficiency and reduces the imaging radiation dose and imaging time.However,the method of two-stepping phase shift still needs to move the grating,and the requirement for accuracy of the step position is also very high.According to the problems mentioned above,in this paper we propose a dual energy multi-line X-ray source and a dual energy analysis grating.The dual energy multi-line X-ray source can emit two different levels of X-ray structure light,which can replace the X-ray source and source grating.The dual energy analysis grating is composed of two different types of scintillator materials,which are in staggered distribution.One is scintillator material that can transform high energy X-ray into visible light,and the other one can convert low energy X-ray into visible light.The dual energy analysis grating can replace traditional analysis grating and the conversion screen of X-ray CCD detector.By using the dual energy multi-line X-ray source and dual energy analysis grating in grating-based X-ray differential phase contrast imaging system,a dual energy grating-based X-ray phase contrast imaging system is proposed in this paper.In addition,in this paper we show the structure and imaging principle of the imaging system.The imaging system can achieve high and low energy X-ray imaging without moving grating.Two levels of X-ray imaging are equivalent to the analysis grating displacement π phase,which is in line with the traditional two-stepping method of two image phase shift requirements.Therefore,after the normalization processing of the two kinds of energies,the phase information can be extracted by the traditional two-stepping phase shift method.In order to validate the correctnesses of the imaging principle of the proposed imaging system and extraction method of phase information,the imaging system is simulated.The simulation is performed on the assumption that an X-ray beam passes through a polymethyl methacrylate sphere as a phase specimen,and the method is adopted by using the proposed dual energy X-ray about left and right lumbar imaging to extract phase information.The simulation result shows that the imaging system can realize normal imaging,and the first-order derivative distribution of the sphere phase extracted by the dual energy X-ray method is consistent with the experimental result.%X射线光栅相衬成像存在系统复杂、成像效率低、步迸精度要求高、光栅加工难度大等问题.本文设计了一种双能阵列X射线源和双能分析光栅,并应用于X射线光栅相衬成像,提出了一种双能X射线光栅相衬成像系统,阐述了该成像系统的成像原理和相位信息提取方法.提出的成像系统不需要精密步进平台,精简了成像系统,避免了步进误差导致的成像质量降低问题;两次曝光就可以成像,提高了成像效率;双能阵列X射线源、双能分析光栅的应用避免了源光栅、分析光栅难以加工的问题.对提出的成像系统及其相位提取方法进行了仿真,仿真结果显示成像系统可以正常成像,提取到的检测样本的X射线相衬成像相位一阶导数分布与相关文献实验所得结果一致.

著录项

  • 来源
    《物理学报》|2017年第1期|340-347|共8页
  • 作者单位

    天津工业大学电子与信息工程学院,天津300387;

    天津工业大学,天津市光电检测技术与系统重点实验室,天津300387;

    天津工业大学电子与信息工程学院,天津300387;

    天津工业大学,天津市光电检测技术与系统重点实验室,天津300387;

    天津工业大学电子与信息工程学院,天津300387;

    天津工业大学,天津市光电检测技术与系统重点实验室,天津300387;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类
  • 关键词

    X射线相衬成像; 双能阵列X射线源; 双能分析光栅;

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号