并行折叠计数器的BIST方案

摘要

本文提出了一种新的基于初始状态的并行折叠计数结构,并给出了建议的多扫描链的BIST方案.与国际上同类方法相比,该方案需要更少的测试数据存储容量、更短的测试应用时间,其平均测试应用时间是同类方案的0.265％,并且能很好地适用于传统的EDA设计流程.%A new architecture of parallel folding counters is presented and a preferred BIST scheme of multiple scan chains is advised.Compared to international similar approaches,the proposed scheme needs less storage volume and shorter test application time,test application time is only as much as 0.265% of other similar scheme,and is compatible with traditional scan-based design flow.