基于 V93000的 SoC 中端口非测试复用的ADC 和 DAC IP 核性能测试方案

摘要

SoC （System-on-a-Chip ）芯片设计中，由于芯片测试引脚数目的限制以及基于芯片性能的考虑，通常有一些端口不能进行测试复用的IP（Intellectual Property ）核将不可避免地被集成在SoC芯片当中。对于端口非测试复用IP核，由于其端口不能被直接连接到ATE（Automatic Test Equipment ）设备的测试通道上，由此，对端口非测试复用IP核的测试将是对SoC芯片进行测试的一个重要挑战。在本文当中，我们分别提出了一种基于V93000测试仪对端口非测试复用ADC （Analog-to-Digital Converter ）以及DAC （Digital-to-Analog Converter ）IP核的性能参数测试方法。对于端口非测试复用ADC和DAC IP核，首先分别为他们开发测试程序并利用V93000通过SoC芯片的EMIF （External Memory Interface ）总线对其进行配置。在对ADC和DAC IP核进行配置以后，就可以通过V93000捕获ADC IP核采样得到的数字代码以及通过V93000采样DAC IP核转换得到的模拟电压值，并由此计算ADC以及DAC IP核的性能参数。实验结果表明，本文分别提出的针对端口非测试复用ADC以及DAC IP核测试方案非常有效。%IP cores without I/O multiplexing are typically unavoidable to be embedded into SoC due to the necessary consid-erations such as pin constraint and performance optimization during the design stage .Hence ,one of the serious challenges for SoC testing is how to effectively test IP cores without I/O multiplexing because the ports of IP cores without I/O multiplexing cannot be directly connected to the ATE channels .In this paper ,we propose test methods for ADC and DAC IP cores without I/O multiplex-ing using V93000 ATE respectively .In order to test the ADC and DAC IP cores without I/O multiplexing ,test programs are firstly developed and loaded into V93000 to configure the two cores via EMIF bus .Then the digital codes and the analog voltage values re-spectively converted by ADC and DAC IP cores of SoC are captured by V93000 for performance parameter calculation .Experimen-tal results show that the proposed methods are effective .