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Advanced algorithms for VLSI: Statistical circuit optimization and cyclic circuit analysis.

机译:VLSI的高级算法:统计电路优化和循环电路分析。

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摘要

This work focuses on two emerging fields in VLSI. The first is use of statistical formulations to tackle one of the classical problems in VLSI design and analysis domains, namely gate sizing. The second is on analysis of nontraditional digital systems in the form of cyclic combinational circuits.;In the first part, a new approach for enhancing the process-variation tolerance of digital circuits is described. We extend recent advances in statistical timing analysis into an optimization framework. Our objective is to reduce the performance variance of a technology-mapped circuit where delays across elements are represented by random variables which capture the manufacturing variations. We introduce the notion of statistical critical paths, which account for both means and variances of performance variation. An optimization engine is used to size gates with a goal of reducing the timing variance along the statistical critical paths. Circuit optimization is carried out using a gain-based gate sizing algorithm that terminates when constraints are satisfied or no further improvements can be made. We show optimization results that demonstrate an average of 72% reduction in performance variation at the expense of average 20% increase in design area.;In the second part, we tackle the problem of analyzing cyclic circuits. Compiling high-level hardware languages can produce circuits containing combinational cycles that can never be sensitized. Such circuits do have well-defined functional behavior, but wreak havoc with most tools, which assume acyclic combinational logic. As such, some sort of cycle-removal step is usually necessary. We present an algorithm able to quickly and exactly characterize all combinational behavior of a cyclic circuit. It used a combination of explicit and implicit methods to compute input patterns that make the circuit behave combinationally. This can be used to restructure the circuit into an acyclic equivalent, report errors, or as an optimization aid. Experiments show our algorithm runs several orders of magnitude faster than existing ones on real-life cyclic circuits, making it useful in practice.
机译:这项工作集中在VLSI的两个新兴领域。首先是使用统计公式来解决VLSI设计和分析领域中的经典问题之一,即门控尺寸。第二部分以循环组合电路的形式分析非传统数字系统。在第一部分中,描述了一种增强数字电路的过程变化容限的新方法。我们将统计时序分析的最新进展扩展到优化框架中。我们的目标是减少技术映射电路的性能差异,该电路中元件之间的延迟由捕获制造差异的随机变量表示。我们引入统计关键路径的概念,该路径同时考虑了性能变化的均值和方差。优化引擎用于确定门的大小,目的是减少沿统计关键路径的时序差异。电路优化使用基于增益的门选型算法执行,该算法在满足约束条件或无法进行进一步改进时终止。我们显示的优化结果表明,性能变化平均减少了72%,而设计面积却平均增加了20%。;第二部分,我们解决了分析循环电路的问题。编译高级硬件语言可能会产生包含永远不会敏感的组合循环的电路。这样的电路确实具有明确定义的功能行为,但对大多数假定非循环组合逻辑的工具造成严重破坏。因此,通常需要某种循环移除步骤。我们提出了一种能够快速,准确地表征循环电路的所有组合行为的算法。它使用显式和隐式方法的组合来计算使电路具有组合性能的输入模式。这可用于将电路重组为非循环等效物,报告错误或作为优化辅助。实验表明,我们的算法在现实循环电路中的运行速度比现有算法快几个数量级,在实践中很有用。

著录项

  • 作者

    Neiroukh, Osama.;

  • 作者单位

    Portland State University.;

  • 授予单位 Portland State University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2008
  • 页码 104 p.
  • 总页数 104
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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