首页> 外文学位 >Josephson Junctions with Tunnel Barriers Grown Via In Situ Atomic Layer Deposition.
【24h】

Josephson Junctions with Tunnel Barriers Grown Via In Situ Atomic Layer Deposition.

机译:通过原位原子层沉积生长的隧道势垒的约瑟夫森交界处。

获取原文
获取原文并翻译 | 示例

摘要

Since the 1970's, silicon technology has increased processing power by increasing the density of silicon transistors according to Moore's Law. However, silicon transistor feature sizes are approaching a minimum size limit, and a new paradigm is required to continue progress. Quantum computing is a promising paradigm that relies on the entanglement of macroscopic quantum objects, called qubits, to perform calculations. Josephson junction (JJ) based qubits are a promising candidate for the implementation of quantum computers. However, JJ qubits have suffered from poor coherence. A major source of decoherence in JJ qubits is two-level fluctuators in the insulating materials of the JJ circuit, particularly oxygen vacancies and interstitials in the thermally oxidized tunnel barrier. In order to realize the full potential of JJ qubits, an alternative method to thermal oxidation must be found for tunnel barrier growth.;This work explores using atomic layer deposition (ALD) for the growth of ultrathin (~ 1 nm) tunnel barriers in JJs. A unique thin film deposition tool was built which integrates ultra-high vacuum sputtering with ALD in situ. The growth of ALD-Al2O3 on in situ sputtered Al films was studied in depth. Atomic force microscopy and ellipsometry were used to determine that ALD-Al2O3 grows conformally on Al, but a ~ 2 nm thermally oxidized interfacial layer (IL) develops between the Al and Al2O3 for ALD films > 2 nm. The thickness of this IL decreased when the Al film was < 2 nm, confirming the IL is a thermal oxide. As a proof of concept, Nb/Al/ALD-Al2O3/Nb trilayers with ultrathin (< 1 nm) tunnel barriers were grown and processed into JJs. The junction specific resistance and gap current density were found to depend exponentially on the ALD film thickness, indicating that the tunnel barrier thickness can be controlled by ALD. Despite evidence for an estimated 0.8 nm interfacial layer in the ultrathin tunnel barrier, this work incontrovertibly concludes that ALD can be used to produce quality JJs.
机译:自1970年代以来,根据摩尔定律,硅技术通过增加硅晶体管的密度来提高处理能力。然而,硅晶体管特征尺寸正接近最小尺寸极限,并且需要新的范例来继续进行。量子计算是一种有前途的范例,它依赖于称为量子位的宏观量子对象的纠缠来执行计算。基于约瑟夫森结(JJ)的量子位是实现量子计算机的有希望的候选者。但是,JJ量子位的一致性很差。 JJ量子位的退相干的主要来源是JJ电路的绝缘材料中的两级涨落,尤其是热氧化隧道势垒中的氧空位和间隙。为了实现JJ量子位的全部潜力,必须找到一种热氧化方法来替代隧道势垒生长。;这项工作探索了使用原子层沉积(ALD)来生长JJs中超薄(〜1 nm)隧道势垒的方法。 。构建了独特的薄膜沉积工具,该工具将超高真空溅射与原位ALD集成在一起。深入研究了溅射Al膜上ALD-Al2O3的生长。原子力显微镜和椭偏仪用于确定ALD-Al2O3在Al上共形生长,但是对于大于2 nm的ALD膜,Al和Al2O3之间会形成〜2 nm的热氧化界面层(IL)。当Al膜<2nm时,该IL的厚度减小,确认该IL是热氧化物。作为概念的证明,生长具有超薄(<1 nm)隧道势垒的Nb / Al / ALD-Al2O3 / Nb三层,并将其加工成JJ。发现结的比电阻和间隙电流密度与ALD膜厚度成指数关系,表明隧道势垒厚度可以由ALD控制。尽管有证据表明在超薄隧道势垒中估计有0.8 nm的界面层,但这项工作无可辩驳地得出结论,ALD可用于生产高质量的JJ。

著录项

  • 作者

    Elliot, Alan J.;

  • 作者单位

    University of Kansas.;

  • 授予单位 University of Kansas.;
  • 学科 Atomic physics.;Materials science.
  • 学位 Ph.D.
  • 年度 2014
  • 页码 94 p.
  • 总页数 94
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号