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RRAM-based PUF: Design and Applications in Cryptography.

机译:基于RRAM的PUF:密码学的设计和应用。

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摘要

The recent flurry of security breaches have raised serious concerns about the security of data communication and storage. A promising way to enhance the security of the system is through physical root of trust, such as, through use of physical unclonable functions (PUF). PUF leverages the inherent randomness in physical systems to provide device specific authentication and encryption.;In this thesis, first the design of a highly reliable resistive random access memory (RRAM) PUF is presented. Compared to existing 1 cell/bit RRAM, here the sum of the read-out currents of multiple RRAM cells are used for generating one response bit. This method statistically minimizes any early-lifetime failure due to RRAM retention degradation at high temperature or under voltage stress. Using a device model that was calibrated using IMEC HfOx RRAM experimental data, it was shown that an 8 cells/bit architecture achieves 99.9999% reliability for a lifetime >10 years at 125°C. Also, the hardware area overhead of the proposed 8 cells/bit RRAM PUF architecture was smaller than 1 cell/bit RRAM PUF that requires error correction coding to achieve the same reliability.;Next, a basic security primitive is presented, where the RRAM PUF is embedded in the cryptographic module, SHA-256. This architecture is referred to as Embedded PUF or EPUF. EPUF has a security advantage over SHA-256 as it never exposes the PUF response to the outside world. Instead, in each round, the PUF response is used to change a few bits of the message word to produce a unique message digest for each IC. The use of EPUF as a key generation module for AES is also shown. The hardware area requirement for SHA-256 and AES-128 is then analyzed using synthesis results based on TSMC 65nm library. It is shown that the area overhead of 8 cells/bit RRAM PUF is only 1.08% of the SHA-256 module and 0.04% of the AES-128 module. The security analysis of the PUF based systems is also presented. It is shown that the EPUF-based systems are resistant towards standard attacks on PUFs, and that the security of the cryptographic modules is not compromised.
机译:最近出现的一系列安全漏洞已引起人们对数据通信和存储安全性的严重关注。增强系统安全性的一种有前途的方法是通过物理信任根,例如通过使用物理不可克隆功能(PUF)。 PUF利用物理系统中固有的随机性来提供特定于设备的身份验证和加密。本文首先提出了一种高可靠性的电阻式随机存取存储器(RRAM)PUF的设计。与现有的1单元/位RRAM相比,此处多个RRAM单元的读出电流之和用于生成一个响应位。从统计学上讲,该方法最大程度地减少了由于高温或在电压应力下RRAM保持性能下降而引起的任何早期寿命故障。使用通过IMEC HfOx RRAM实验数据校准的设备模型,可以证明8位/位架构在125°C下的10年以上使用寿命中可实现99.9999%的可靠性。同样,提出的8单元/位RRAM PUF体系结构的硬件区域开销小于1单元/位RRAM PUF,后者需要进行纠错编码以实现相同的可靠性。接下来,提出了一个基本的安全原语,其中RRAM PUF嵌入在加密模块SHA-256中。此体系结构称为嵌入式PUF或EPUF。 EPUF与SHA-256相比具有安全优势,因为它从未将PUF响应暴露给外界。取而代之的是,在每个回合中,PUF响应用于更改消息字的几位,以为每个IC产生唯一的消息摘要。还显示了使用EPUF作为AES的密钥生成模块。然后使用基于TSMC 65nm库的综合结果来分析SHA-256和AES-128的硬件区域要求。结果表明,每单元8个单元的RRAM PUF的区域开销仅为SHA-256模块的1.08%和AES-128模块的0.04%。还介绍了基于PUF的系统的安全性分析。结果表明,基于EPUF的系统可以抵抗对PUF的标准攻击,并且加密模块的安全性不会受到损害。

著录项

  • 作者

    Shrivastava, Ayush.;

  • 作者单位

    Arizona State University.;

  • 授予单位 Arizona State University.;
  • 学科 Electrical engineering.;Computer science.
  • 学位 M.S.
  • 年度 2015
  • 页码 68 p.
  • 总页数 68
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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