首页> 外文学位 >CHEMICAL AND ELECTRICAL PROPERTIES OF GRAIN BOUNDARIES IN POLYCRYSTALLINE SILICON.
【24h】

CHEMICAL AND ELECTRICAL PROPERTIES OF GRAIN BOUNDARIES IN POLYCRYSTALLINE SILICON.

机译:多晶硅中晶界的化学和电学性质。

获取原文
获取原文并翻译 | 示例

摘要

Experimental techniques for the investigation of the electrical and chemical properties of grain boundaries are developed and utilized for the study of cast polycrystalline silicon. Totally automated electron beam induced current (EBIC) techniques are developed, including hardware and software development, and are used for the study of recombination properties of silicon grain boundaries. Automation was used to maximize the precision and accuracy of the EBIC data and to allow large numbers of measurements to be performed to determine the effects of experimental parameters on reproducibility and beam damage. EBIC, secondary electron and optical microscopy techniques are used to characterize the grain size and structure in Wacker Silso cast polycrystalline silicon. The grain size is found to be 1.63 (+OR-) 0.43 millimeters. Grain structure was found to be controlled by the casting process used to form the material. Twin boundaries are found to be electrically inactive. Preferential grain boundary diffusion of phosphorus in silicon grain boundaries is measured using both bevel and stain, and bevel/EBIC techniques. The effects of heat treatments at 600, 750 and 900(DEGREES)C are investigated extensively. An MIS device structure which does not require high temperature processing (> 200(DEGREES)C) for fabrication is developed and utilized for these studies. EBIC analysis results show that grain boundary recombination velocity is substantially increased by heating cast polysilicon to temperatures as low as 600(DEGREES)C, whereas no effects were seen at 400(DEGREES)C. Heat treatments up to 900(DEGREES)C are investigated. Use of complementary surface analysis techniques are developed which show that these heat treatments result in oxygen segregation to grain boundaries. In-situ fracturing techniques for Auger electron spectroscopy and secondary ion mass spectroscopy analysis of grain boundaries are developed. Ion microscopy techniques are developed and used to complement the fracture studies. Local oxygen concentrations of 0.1 atomic % were measured. Based on the time and temperature dependence of the activation of grain boundary recombination, it is concluded that oxygen segregation is responsible for the activation.
机译:开发了用于研究晶界的电学和化学性质的实验技术,并将其用于铸造多晶硅的研究。开发了全自动电子束感应电流(EBIC)技术,包括硬件和软件开发,并用于研究硅晶界的复合性质。自动化用于最大化EBIC数据的精度和准确性,并允许执行大量测量以确定实验参数对重现性和光束损伤的影响。 EBIC,二次电子和光学显微镜技术用于表征Wacker Silso铸造多晶硅的晶粒尺寸和结构。发现晶粒尺寸为1.63(+或-)0.43毫米。发现晶粒结构受用于形成材料的铸造工艺控制。发现孪晶边界是无电的。使用斜面和污点以及斜面/ EBIC技术测量磷在硅晶界中的优先晶界扩散。广泛研究了600、750和900(DEGREES)C热处理的影响。开发了一种不需要高温处理(> 200(DEGREES)C)进行制造的MIS器件结构,并将其用于这些研究。 EBIC分析结果表明,通过将浇铸的多晶硅加热到低至600(DEGREES)C的温度,晶界复合速度大大提高,而在400(DEGREES)C则没有观察到影响。研究了高达900(DEGREES)C的热处理。已经开发出使用互补表面分析技术的方法,该技术表明这些热处理会导致氧偏析到晶界。开发了用于俄歇电子能谱的原位断裂技术和晶界的二次离子质谱分析技术。开发了离子显微镜技术,并将其用于断裂研究。测量了0.1原子%的局部氧浓度。基于晶界复合活化的时间和温度依赖性,可以得出结论认为氧的离析是活化的原因。

著录项

  • 作者

    RUSSELL, PHILLIP EUGENE.;

  • 作者单位

    University of Florida.;

  • 授予单位 University of Florida.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 1982
  • 页码 191 p.
  • 总页数 191
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号