首页> 外文学位 >THE EFFECTS OF GRAIN BOUNDARIES ON THE CARRIER TRANSPORT IN POLYCRYSTALLINE SILICON.
【24h】

THE EFFECTS OF GRAIN BOUNDARIES ON THE CARRIER TRANSPORT IN POLYCRYSTALLINE SILICON.

机译:晶界对多晶硅载流子传输的影响。

获取原文
获取原文并翻译 | 示例

摘要

The effect of grain boundaries on the minority carrier transport in polycrystalline silicon has been studied theoretically. By assuming Gaussian energy distributions of grain boundary interface states, calculations have been performed of the recombination current density and the recombination velocity at grain boundaries for different energy distributions. The distinction is also made between the minority carrier recombination velocity at the grain boundary itself, and the effective recombination velocity for the collection of these carriers by the adjacent space-charge regions. The results indicate that both velocities depend strongly on the grain boundary trap distribution and the illumination intensity, and may have a maximum value. Furthermore, grain boundary traps are likely to distribute in more than one energy level.; Grain boundaries are also characterized according to their photovoltaic and photoconductance responses, which are related to the grain boundary trap distribution. Photoconductance transient response in poycrystalline silicon has also been studied theoretically and experimentally. The theory predicts that, in principle, by measuring the transient response as a function of the illumination intensity and the temperature, various grain boundary parameters can be deduced. Based on the theory, the "laser-spot-induced photoconductance method" has been developed to measure the grain boundary parameters. This technique allows local probing of individual grain boundary in a sample containing multiple grains and is useful for studying deep level grain boundary trap states. Experimental results obtained agree closely with the theory. Some p-type polycrystalline silicon grain boundaries are found to contain donor-like states both near and above the midgap, instead of exclusively at the midgap.; The effect of the grain boundaries on the majority carrier transport in aluminum-polycrystalline-silicon (Wacker) Schottky-barrier solar cells is also studied theoretically. Calculations show that even in large-grain sample, the transport can be bulk-limited, depending on the grain boundary trap distribution. Comparison with the experimental results indicates that some grain boundaries may be represented by a fixed interface charge and a uniformly distributed interface state density. The fixed interface charge can be ascribed to the existence of donor-like states above the midgap, consistent with the photoconductance experimental observation.
机译:从理论上研究了晶界对多晶硅中少数载流子传输的影响。通过假设晶界界面态的高斯能量分布,对不同能量分布的晶界处的复合电流密度和复合速度进行了计算。晶界本身的少数载流子复合速度与相邻空间电荷区域收集这些载流子的有效复合速度之间也有区别。结果表明,两种速度都强烈依赖于晶界陷阱分布和照明强度,并且可能具有最大值。此外,晶界陷阱可能分布在一个以上的能级上。晶界还根据其光伏和光电导响应进行表征,这与晶界陷阱分布有关。理论上和实验上也研究了多晶硅中的光电导瞬态响应。该理论预测,原则上,通过测量作为照明强度和温度的函数的瞬态响应,可以推导出各种晶界参数。基于该理论,已经开发了“激光点诱导的光电导方法”来测量晶界参数。该技术可以对包含多个晶粒的样品中的单个晶粒边界进行局部探测,对于研究深层晶粒边界陷阱状态非常有用。获得的实验结果与理论非常吻合。发现一些p型多晶硅晶界在中能隙附近和上方都含有供体样态,而不是仅在中能隙处。理论上还研究了晶界对铝-多晶硅(Wacker)肖特基势垒太阳能电池中多数载流子传输的影响。计算表明,即使在大颗粒样品中,运输也可能受到体积限制,这取决于晶界陷阱的分布。与实验结果的比较表明,某些晶界可能由固定的界面电荷和均匀分布的界面态密度表示。固定界面电荷可归因于中空隙上方存在供体样态,这与光电导实验观察一致。

著录项

  • 作者

    POON, EDWARD KIN-KONG.;

  • 作者单位

    Columbia University.;

  • 授予单位 Columbia University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 1984
  • 页码 192 p.
  • 总页数 192
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号