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Damage mechanics of microelectronic packaging under combined dynamic and thermal loading.

机译:在动态和热载荷作用下微电子包装的损伤机理。

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摘要

Pb/Sn solder joints are extensively used as surface mount technology (SMT) packaging interconnects. Thermal cycling of semiconductor devices induces thermal fatigue in solder joints. On the other hand, when such devices are used in automotive and military applications, they are subjected to severe vibrations. There is very little research results reported in the literature on the subject of concurrent dynamic/thermal analysis of solder joints. The primary objective of this research is to develop a constitutive model for Pb/Sn solder to study reliability of power electronics and SMT interconnects under dynamic, thermal and concurrent dynamic and thermal loadings.; Solder is a highly nonlinear material and exhibits time dependent viscous behavior. So a viscoplasticity based constitutive model is developed. A thermo dynamic damage theory is implemented in the model along with effect of microstructure to analyze the distribution and progress of damage in the solder joints and the number of cycles to failure. A nonlinear viscoplastic finite element algorithm is then developed which implements the damage mechanics based constitutive model.; In order to verify the constitutive model, a number of case studies are considered and numerical predictions are compared against test data. Several boundary value problems and parametric studies have been solved under thermal, dynamic and concurrent conditions to determine the stress distribution, damage and to assess the fatigue life. The objective of the parametric study is to understand the mechanical behavior of solder joints under different load and boundary conditions.; The important scientific contribution of this dissertation is development of a new constitutive model for Pb/Sn solder taking into account the grain size and damage mechanics. Pb/Sn solder alloys are thermodynamically unstable materials and as they are aged or deformed, they become thermodynamically stable. Their thermomechanical behavior is dependent on microstructure, which in turn depends on solidification or cooling rate. The constitutive model has been developed to characterize this behavior. A new yield surface has been proposed in this dissertation. Coupled dynamic-thermal viscoplastic-damage analysis of eutectic solder alloys is also a major contribution of this dissertation.
机译:铅/锡焊点被广泛用作表面贴装技术(SMT)封装互连。半导体器件的热循环会在焊点中引起热疲劳。另一方面,当这种设备用于汽车和军事应用时,它们会遭受剧烈的振动。关于焊点同时动态/热分析的文献报道很少。这项研究的主要目的是开发一种Pb / Sn焊料的本构模型,以研究动力电子,SMT互连在动态,热以及同时的动态和热负载下的可靠性。焊料是一种高度非线性的材料,并表现出随时间变化的粘性行为。因此,建立了基于粘塑性的本构模型。在模型中实施了热动力损伤理论以及微观结构的影响,以分析焊点中损伤的分布和进程以及失效循环的次数。然后,开发了一种非线性粘塑性有限元算法,该算法实现了基于损伤力学的本构模型。为了验证本构模型,考虑了许多案例研究,并将数值预测与测试数据进行了比较。在热,动态和同时条件下,已经解决了一些边界值问题和参数研究,以确定应力分布,损伤和评估疲劳寿命。参数研究的目的是了解在不同负载和边界条件下焊点的机械性能。论文的重要科学贡献是在考虑晶粒尺寸和损伤机理的基础上,开发了一种新的Pb / Sn焊料本构模型。 Pb / Sn焊料合金是热力学不稳定的材料,随着它们的时效或变形,它们变得热力学稳定。它们的热机械行为取决于微观结构,而微观结构又取决于固化或冷却速率。本构模型已经开发出来以表征这种行为。本文提出了一种新的屈服面。共晶焊料合金的动态-热-粘塑性-损伤耦合分析也是本论文的主要贡献。

著录项

  • 作者

    Chandaroy, Rumpa.;

  • 作者单位

    State University of New York at Buffalo.;

  • 授予单位 State University of New York at Buffalo.;
  • 学科 Engineering Civil.; Engineering Packaging.
  • 学位 Ph.D.
  • 年度 1998
  • 页码 279 p.
  • 总页数 279
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 建筑科学;包装工程;
  • 关键词

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