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Study of pulse plating and reaction mechanism of trivalent chromium deposition process.

机译:三价铬沉积过程的脉冲镀及反应机理研究。

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Trivalent chromium bath is relatively non-toxic compared with hexavalent chromium bath. However, it is difficult to obtain thick chromium deposits from trivalent chromium bath with direct current plating. Pulse current plating of thick chromium deposits was studied in a trivalent chromium bath containing either ammonium formate or sodium hypophosphite as the complexing agents. It was found that the plating rate of chromium deposit using pulse current was higher than that of direct current. Pulse current improved the maximal deposit thickness that could be obtained from the trivalent chromium baths. In addition, pulse current decreased the internal stress of trivalent chromium deposit by 25% to 75%. The microhardness of trivalent chromium deposit obtained with pulse current was comparable to that of chromium deposit obtained with direct current.; In a trivalent chromium bath containing ammonium formate and sodium acetate as the complexing agents, the reduction reaction of trivalent chromium electrodeposition was studied. It was found that without the presence of complexing agents chromium deposit could not be obtained. Chromium electrodeposition reaction occurred only in a narrow range of applied potentials, and the dominant reaction was hydrogen evolution reaction. The measured cathodic Tafel slope for chromium electrodeposition was -0.15 V/decade. Rotating disk experiments showed that the chromium electrodeposition reaction was diffusion controlled. AC impedance experiments did not reveal any existence of a cathode film.
机译:与六价铬浴相比,三价铬浴相对无毒。然而,用直流电镀很难从三价铬浴中获得厚的铬沉积物。在含有甲酸铵或次磷酸钠作为络合剂的三价铬浴中研究了厚铬沉积物的脉冲电流镀层。发现使用脉冲电流的铬沉积物的镀覆速率高于直流电。脉冲电流改善了可从三价铬浴中获得的最大沉积物厚度。此外,脉冲电流将三价铬沉积物的内部应力降低了25%至75%。用脉冲电流获得的三价铬沉积物的显微硬度与用直流电获得的铬沉积物的显微硬度相当。在以甲酸铵和乙酸钠为络合剂的三价铬浴中,研究了三价铬电沉积的还原反应。已经发现,如果不存在络合剂,则不能获得铬沉积物。铬电沉积反应仅在狭窄的施加电位范围内发生,主要的反应是析氢反应。测得的铬电沉积阴极塔菲尔斜率是-0.15 V /十倍。转盘实验表明铬电沉积反应是扩散控制的。交流阻抗实验没有发现阴极膜的存在。

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