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Properties of aluminum gallium arsenide native oxides for integrated photonics and optoelectronics applications.

机译:集成光子学和光电子学应用的砷化铝镓天然氧化物的性能。

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摘要

The properties of AlGaAs native oxides have been investigated and single heterostructure (SH) and double heterostructure (DH) native oxide planar waveguides have been realized. Prism coupling, secondary ion mass spectrometry (SIMS), Fourier transform infrared (FTIR) transmission spectroscopy and other techniques are used to characterize the oxide waveguides. Propagation losses are measured for SH native oxide waveguides. The presence of hydroxyl (OH) groups in AlGaAs native oxides is shown to slightly increase the waveguide loss at λ = 1.55 μm. The wet thermal oxidation process has been extensively investigated for AlxGa1−xAs over a wide range of Al compositions (0.3 x 0.9). An improvement in the process for oxidation of low Al composition AlxGa1−xAs (x 0.8) has been achieved by controllably adding trace quantities of O2 to the N 2 + H2O process gas. The complicated effects of O2 + N2 “mixed carrier gas” on oxidation rates and the surface quality of oxides have been investigated and applied to reduce the propagation loss of a SH waveguide. The role of added O2 has been analyzed in relation to the possible chemical reactions involved. The effects of mixed carrier gas on the lateral oxidation of Al0.98Ga 0.02As is also explored but shown to be negligible. Two modified AlGaAs SHs designed for reduced planar oxide waveguide propagation loss have also been processed and characterized, with losses as low as 4 dB/cm at λ = 1.55 μm achieved. Finally, in other experimental results it is shown that “deep-oxidation” (i.e., through a quantum well heterostructure (QWH) containing a low Al composition waveguide and GaAs quantum well) can be attained by using controllably-mixed O2 + N2 carrier gas, which effectively modifies the oxidation rate selectivity between high and low x AlxGa1−xAs. This achievement eliminates the need for the additional impurity induced layer disordering (IILD) process step used in prior deep-oxidation technology to intermix high and low x AlxGa1−xAs in preparation for oxidation. Deep-oxidation enables the realization of strongly-confined, curved optical waveguides required for routing signals around an optical “chip.” This discovery greatly simplifies the process to a more manufacturable and, thus, commercially viable level, and may stimulate further advances in optoelectronics devices and photonic integrated circuits.
机译:研究了AlGaAs天然氧化物的性能,并实现了单异质结构(SH)和双异质结构(DH)天然氧化物平面波导。棱镜耦合,二次离子质谱(SIMS),傅里叶变换红外(FTIR)透射光谱和其他技术用于表征氧化物波导。测量SH本征氧化物波导的传播损耗。 AlGaAs天然氧化物中羟基(OH)的存在显示出在λ= 1.55μm时会稍微增加波导损耗。湿热氧化过程已经广泛研究了Al x Ga 1-x As的广泛组成范围(0.3 可以改善低Al组成的Al x Ga 1-x As(x <0.8)的氧化工艺2 添加到N 2 + H 2 O处理气体中。研究了O 2 + N 2 “混合载气”对氧化速率和氧化物表面质量的复杂影响,并将其用于减少SH的传播损失波导。分析了添加的O 2 的作用与可能发生的化学反应的关系。还研究了混合载气对Al 0.98 Ga 0.02 As的侧向氧化的影响,但可忽略不计。还设计和表征了两种用于减少平面氧化物波导传播损耗的改性AlGaAs SH,并在λ= 1.55μm时实现了低至4 dB / cm的损耗。最后,在其他实验结果中表明,通过可控地使用,可以实现“深氧化”(即通过包含低铝成分波导和GaAs量子阱的量子阱异质结构(QWH))。混合的O 2 + N 2 载气,有效地改变了高和低x Al x Ga 1之间的氧化速率选择性-x As。这一成就消除了在现有的深度氧化技术中使用额外的杂质诱导层无序(IILD)工艺步骤来混合高低x Al x Ga 1-x 的需求。如在准备氧化。深度氧化可实现在光“芯片”周围路由信号所需的强约束,弯曲的光波导。这一发现极大地简化了工艺,使其更易于制造,从而在商业上可行,并可能刺激光电子器件和光子集成电路的进一步发展。

著录项

  • 作者

    Luo, Yong.;

  • 作者单位

    University of Notre Dame.;

  • 授予单位 University of Notre Dame.;
  • 学科 Engineering Electronics and Electrical.; Physics Optics.; Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 135 p.
  • 总页数 135
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;光学;工程材料学;
  • 关键词

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