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Experimental study and numerical analysis of aging of piezoelectric resonators.

机译:压电谐振器老化的实验研究和数值分析。

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摘要

Aging of piezoelectric (quartz crystal) resonator has been identified as one of the most important quality control problems of quartz crystal products. Aging is defined as frequency change with time. Aging in quartz resonators can be due to several sources such as mass transfer due to contamination inside the resonator enclosure, stress-strain in the resonator blank, quartz defect, etc. In this study, the stress-strain effect, which has been believed so many years as a dominant factor contributing to aging, was studied. These effects are caused mainly by the long-term properties of bonding adhesive that attach quartz crystal plate to the ceramic base package in addition to the thermal mismatch between quartz crystal and adhesive. With the available accelerating testing method such as temperature-controlled chamber, the stress-strain induced aging in the quartz crystal resonators can be investigated. Because of the miniaturized size of the resonator, a digital image analysis method called Image Intensity Matching Technique was applied to obtain deformation patterns in the quartz blank due to thermal load. Our preliminary results have shown that the un-symmetric plane deformations may be a dominant contributing factor to aging induced frequency shift. For simulation purposes, finite element analysis was used to investigate the deformation patterns (i.e., stress-strain distributions) and corresponding natural frequency shift in the piezoelectric resonators. The viscoelastic behavior of mounting adhesives were incorporated into analysis to show the dominant effect of long term behavior of stress-strain developed in the crystal resonators. For this purpose, creep test was conducted to obtain viscoelastic parameter of conductive adhesive. Some geometrical aspects, such as uneven mounting supports due to distances, volumes and heights of the adhesives were simulated in the model. Also, contamination effect due to mass loading in the electrode's region was studied to investigate which regions have significant contribution to aging.
机译:压电(石英晶体)谐振器的老化已被确定为石英晶体产品最重要的质量控制问题之一。老化定义为频率随时间变化。石英谐振器的老化可能是由于多种原因引起的,例如,由于谐振器外壳内部的污染而引起的质量传递,谐振器毛坯中的应力应变,石英缺陷等。在这项研究中,应力应变效应被认为是如此。研究了许多年作为导致衰老的主要因素。这些影响主要是由于除了石英晶体和粘合剂之间的热失配外,还将石英晶体板附着到陶瓷基础封装的粘合剂的长期​​性能所致。利用诸如温度控制室之类的加速测试方法,可以研究应力应变引起的石英晶体谐振器的老化。由于谐振器的尺寸很小,因此应用了一种称为图像强度匹配技术的数字图像分析方法来获得由于热负荷而导致的石英毛坯中的变形图案。我们的初步结果表明,非对称平面变形可能是导致老化引起的频移的主要因素。出于仿真目的,有限元分析用于研究压电谐振器的变形模式(即应力-应变分布)和相应的固有频率偏移。将安装胶粘剂的粘弹性行为纳入分析,以显示在晶体谐振器中产生的应力应变的长期行为的主要影响。为此,进行蠕变测试以获得导电粘合剂的粘弹性参数。在模型中模拟了一些几何方面,例如由于粘合剂的距离,体积和高度导致的不均匀安装支撑。此外,还研究了由于电极区域中的质量负载导致的污染效应,以研究哪些区域对老化有重大影响。

著录项

  • 作者

    Asiz, Andi.;

  • 作者单位

    University of Colorado at Boulder.;

  • 授予单位 University of Colorado at Boulder.;
  • 学科 Civil engineering.;Mechanical engineering.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 208 p.
  • 总页数 208
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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