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Electron scattering contrast in unstained mesoscopic polymers.

机译:未染色的介观聚合物中的电子散射对比。

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摘要

Due to the fact that polymers scatter electrons weakly, heavy-element staining is usually required when preparing polymer specimens for transmission electron microscopy (TEM). Staining enhances image contrast but can introduce artifacts. These artifacts are especially problematic in high-resolution imaging of polymer nanostructures and interfaces. This thesis begins with an experimental demonstration of such staining artifacts. Phase-contrast imaging is one alternative method in TEM for imaging unstained polymer structures. This thesis compares two phase-contrast imaging techniques: off-axis transmission electron holography and focal-series imaging. The focal-series method retrieves the image phase from the recorded image intensity at different values of microscope focus. It can be understood in terms of image transfer theory. Off-axis transmission electron holography retrieves the image phase by interfering the image wave with a reference wave. A field-emission TEM is required, because of its high coherence. Using arborescent graft poly(styrene) nanoparticles as model specimens, phase-contrast images from both methods have been analyzed and compared. Holographic imaging shows significantly higher contrast of unstained polymer samples than does the focal-series method. Holography also provides 3-D information from 2-D projected TEM images when the specimen mean inner potential is known. High-resolution holography has significant opportunity to study nanospecimens like viruses, proteins, and dendritic polymers. This thesis concludes with a discussion of the possibility of using spatially-resolved electron energy-loss spectroscopy, an another alternative method of studying unstained polymer structure using chemical or bonding maps, to image polymer fine structure without staining.
机译:由于聚合物对电子的散射较弱,因此在制备用于透射电子显微镜(TEM)的聚合物样品时通常需要重元素染色。染色可增强图像对比度,但会引入伪影。这些假象在聚合物纳米结构和界面的高分辨率成像中特别成问题。本论文从这种染色伪影的实验证明开始。相差成像是TEM中用于对未染色的聚合物结构进行成像的另一种方法。本文比较了两种相衬成像技术:离轴透射电子全息和聚焦系列成像。聚焦系列方法从记录的不同显微镜焦点值下的图像强度中检索图像相位。可以根据图像转移理论来理解。离轴透射电子全息术通过将图像波与参考波干涉来恢复图像相位。由于其高相干性,因此需要场发射TEM。使用树状接枝聚(苯乙烯)纳米颗粒作为模型样品,分析和比较了两种方法的相衬图像。全息成像显示未染色的聚合物样品的对比度明显高于焦系列法。当已知样本平均内部电势时,全息术还可以从2D投影TEM图像中提供3D信息。高分辨率全息照相具有研究诸如病毒,蛋白质和树突状聚合物之类的纳米标本的重要机会。本文最后讨论了使用空间分辨电子能量损失谱的可能性,这是使用化学图或键合图研究未染色的聚合物结构的另一种替代方法,可以对聚合物的精细结构进行成像而不产生污染。

著录项

  • 作者

    Chou, Tseng-Ming.;

  • 作者单位

    Stevens Institute of Technology.;

  • 授予单位 Stevens Institute of Technology.;
  • 学科 Engineering Materials Science.; Plastics Technology.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 176 p.
  • 总页数 176
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;整形外科学(修复外科学);
  • 关键词

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