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Modeling and control of re-entrant semiconductor manufacturing facilities.

机译:可重入半导体制造设施的建模和控制。

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The problem of controlling a modern semiconductor fabrication facility (fab) is one of the most challenging problems facing the semiconductor industry. This work addresses the modeling and control of a modern fab. A virtual five-machine six-step mini-fab benchmark is used to focus the presentation. The benchmark-developed by Intel corporation in collaboration with Arizona State University-contains the features that make modeling and control of a real line challenging.; A Discrete Event System (DES) is one that changes state only at discrete points in time, in response to the occurrence of certain events. Most manufacturing systems fall in the category of discrete event systems, including semiconductor fabrication facilities. Other examples of DESs include: telecommunication networks, parallel processing systems and traffic control systems. One framework that is suitable for analyzing such systems is Max-Plus algebra. In this formalism, maximization and addition are the basic operations. For certain classes of DESs, using this formalism results in linear models, allowing great insight. For this reason, the framework was chosen for modeling the fab.; A technique was developed to model the factory benchmark at the lowest level, using Max-Plus algebra. It is shown that, under certain assumptions, the resulting models are linear in this framework. A factory model building block that allows arbitrary factories of this class to be modeled was developed. Several simple machine policies were evaluated for stability and performance using this framework.; General stability results were developed for systems governed by linear dynamic equations in the Max-Plus framework. Necessary and sufficient conditions for autonomous stability are presented herein. This work extends previously available results for a subclass of Max-Plus linear systems, namely those modeled by strongly connected graphs. The problem of input-output stability is also investigated.; The problem of stabilizing the factory in the presence of disturbances and parameter variation is addressed, and a release policy governor—that regulates the release of starts int the factory has been developed. These results are an extension of previously available results that were developed for higher-level flow models.
机译:控制现代半导体制造设施(fab)的问题是半导体行业面临的最具挑战性的问题之一。这项工作解决了现代晶圆厂的建模和控制问题。虚拟五机六步微型晶圆厂基准测试用于重点介绍。英特尔公司与亚利桑那州立大学合作开发的基准测试包含使真实生产线的建模和控制具有挑战性的功能。离散事件系统(DES)是响应某些事件的发生而仅在离散的时间点更改状态的系统。大多数制造系统都属于离散事件系统,包括半导体制造设施。 DES的其他示例包括:电信网络,并行处理系统和流量控制系统。适用于分析此类系统的一种框架是Max-Plus代数。在这种形式主义中,最大化和增加是基本操作。对于某些类别的DES,使用这种形式主义可以得出线性模型,从而可以提供深刻的见识。因此,选择了用于建模的框架。开发了一种使用Max-Plus代数在最低级别上对工厂基准进行建模的技术。结果表明,在某些假设下,所得模型在此框架内是线性的。开发了工厂模型构建块,该模型允许对此类任意工厂进行建模。使用此框架评估了几个简单的计算机策略的稳定性和性能。在Max-Plus框架中,针对由线性动力学方程式控制的系统开发了总体稳定性结果。本文介绍了自主稳定性的必要条件和充分条件。这项工作扩展了Max-Plus线性系统子类的先前可用结果,即通过强连通图建模的结果。还研究了输入输出稳定性的问题。解决了在存在干扰和参数变化的情况下稳定工厂的问题,并且已经开发了一种释放策略调节器,该调节器调节工厂内部启动的释放。这些结果是为更高级别的流量模型开发的先前可用结果的扩展。

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