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A conceptual framework for the assessment of the criticality of key failure modes in Micro-Electro Mechanical Systems (MEMS) accelerometers.

机译:一个概念框架,用于评估微机电系统(MEMS)加速度计中关键故障模式的重要性。

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摘要

Micro-Electro Mechanical Systems (MEMS) are a fast growing field in microelectronics. MEMS are commonly used as actuators, and sensors with a wide variety of applications in health care, automotives, and the military. The MEMS production cycle can be classified as three basic steps: 1. design process, 2. manufacturing process; and 3. operating cycle. Several studies have been developed for steps 1 and 2, however, information regarding criticality analysis of operational failure modes in MEMS is lacking, and thus, the application of reliability engineering methodologies is needed. MEMS are extremely diverse, and failure modes can be unique for each device. In this study, a conceptual framework for the assessment of the criticality of key failure modes in MEMS accelerometers is proposed.;The conceptual framework establishes seven steps to perform the criticality analysis. The first step consists in the selection of the particular MEMS device and associated technical specifications. The second considers the key environmental conditions for the device's operation. The third and fourth are the selection of the failure mechanism class, and the definition of the failure mechanisms under the given environmental conditions. The fifth step deals with determining the device's common failure modes. Steps six and seven involve the development and implementation of the Failure Mode, Effect and Criticality Analysis (FMECA).;Thirteen MEMS failure modes were analyzed under three different scenarios, and the obtained results discussed. The conceptual framework was successfully completed, the results were validated, and the effectiveness of the applicability of FMECA to automotive MEMS established.
机译:微电子机械系统(MEMS)是微电子领域中发展迅速的领域。 MEMS通常用作致动器和传感器,在医疗保健,汽车和军事领域具有广泛的应用。 MEMS的生产周期可分为三个基本步骤:1.设计过程,2.制造过程; 3.操作周期。已经针对步骤1和步骤2进行了一些研究,但是,缺少有关MEMS中操作故障模式的关键性分析的信息,因此,需要应用可靠性工程方法。 MEMS非常多样化,每个设备的故障模式可能都是唯一的。本研究提出了一种用于评估MEMS加速度计关键失效模式的关键性的概念框架。该概念框架建立了进行关键性分析的七个步骤。第一步包括选择特定的MEMS器件和相关的技术规范。第二个考虑了设备运行的关键环境条件。第三和第四部分是失效机理类别的选择,以及在给定环境条件下失效机理的定义。第五步涉及确定设备的常见故障模式。第六和第七步涉及故障模式,影响和临界度分析(FMECA)的开发和实施。在三种不同情况下分析了13种MEMS故障模式,并讨论了获得的结果。成功完成了概念框架,验证了结果,并确立了FMECA对汽车MEMS的适用性。

著录项

  • 作者

    Sequera, Miguel.;

  • 作者单位

    The University of Alabama.;

  • 授予单位 The University of Alabama.;
  • 学科 Engineering Mechanical.
  • 学位 M.S.
  • 年度 2011
  • 页码 119 p.
  • 总页数 119
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:45:31

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