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First-principle theory of high field carrier transport in semiconductors with application to the study of avalanche photodiodes.

机译:半导体中高场载流子传输的第一性原理及其在雪崩光电二极管研究中的应用。

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摘要

The objective of this thesis work is twofold: to present a theoretical framework to study high-field carrier transport in semiconductor materials and to provide a deep understanding of the transport properties of GaN and HgCdTe. The validation of this model is performed by applying it to the study of Avalanche Photodiodes.;The model we developed is based on Monte Carlo techniques and it includes the full details of the band structure, derived from the empirical pseudopotential method (EPM), and a numerically calculated impact ionization transition rate based on a wave-vector dependent dielectric function. The nonpolar carrier-phonon interaction is treated within the framework of the rigid pseudoion (RPI) approximation using ab initio techniques to determine the phonon dispersion relation. The calculated phonon scattering rates are consistent with the electronic structure and the phonon dispersion relation thus removing adjustable parameters such as deformation potential coefficients. Band-to-band carrier tunneling has been treated by solving the time-dependent multiband Schroedinger equation. The multiband description predicts a considerable increase of the impact ionization coefficients compared with simulations not considering tunneling.;Specifically, the present model has been applied to the study of two distinct semiconductor materials: GaN and HgCdTe. The former is a wide bandgap while the second is a narrow bandgap semiconductor. In spite of their constantly increasing technological reliability both materials lack theoretical understanding of high-field carrier transport.;Avalanche photodiodes (APDs) offer an ideal environment to test and validate the model developed in this thesis work because of the large electric field involved in these devices. APDs based on both GaN and HgCdTe are investigated, consistently with the physics-based models described above. Key quantities such as gain, breakdown voltage, bandwidth and noise characteristics are estimated. The results are found to be in good agreement with experimental data available in literature.
机译:本文工作的目的是双重的:提供一个理论框架来研究半导体材料中的高场载流子传输,并提供对GaN和HgCdTe传输特性的深刻理解。该模型的验证是通过将其应用于雪崩光电二极管的研究来进行的;我们开发的模型基于蒙特卡洛技术,并且包括从经验伪势方法(EPM)导出的能带结构的完整细节,以及基于依赖于波矢量的介电函数的数值计算的碰撞电离跃迁速率。使用从头算技术确定声子色散关系,在刚性伪离子(RPI)近似框架内处理非极性载流子-声子相互作用。计算出的声子散射率与电子结构和声子色散关系一致,因此消除了诸如形变势系数之类的可调节参数。通过求解与时间有关的多频带Schroedinger方程,可以处理带间载波隧道效应。与不考虑隧道效应的模拟相比,多带描述预测了碰撞电离系数的显着增加。具体而言,本模型已用于研究两种不同的半导体材料:GaN和HgCdTe。前者是宽带隙半导体,而第二个是窄带隙半导体。尽管它们的技术可靠性不断提高,但两种材料都缺乏对高场载流子传输的理论理解。;雪崩光电二极管(APD)为测试和验证本文工作中开发的模型提供了理想的环境,因为其中涉及的电场很大设备。与上述基于物理的模型一致,对基于GaN和HgCdTe的APD进行了研究。估算了关键量,例如增益,击穿电压,带宽和噪声特性。发现结果与文献中可获得的实验数据高度吻合。

著录项

  • 作者

    Moresco, Michele.;

  • 作者单位

    Boston University.;

  • 授予单位 Boston University.;
  • 学科 Engineering Electronics and Electrical.;Physics Theory.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2011
  • 页码 126 p.
  • 总页数 126
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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