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Factors affecting carrier transport in ultrafast III-V compound semiconductor based photodiodes.

机译:影响基于超快III-V化合物半导体的光电二极管中载流子传输的因素。

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摘要

This dissertation describes a comparative study conducted on GaAs MSM photodetectors to assess the importance of surface effects on the optical and frequency response characteristics of MSM photodetectors. MSM photodetectors on III-V compound semiconductors are technologically important because of their applications to fiber optic communication systems. While surface effects have been previously ignored, they must be considered in assessing the ultimate performance limits of such devices, especially if nanoscale MSM photodetectors are to be used. A controlled study was carried out in which high quality devices were subjected to surface damage over a known range and the resultant effects of optical and high frequency performance were observed and correlated with the damage.
机译:本文介绍了在GaAs MSM光电探测器上进行的一项比较研究,以评估表面效应对MSM光电探测器的光学和频率响应特性的重要性。 III-V型化合物半导体上的MSM光电探测器在技术上很重要,因为它们已应用于光纤通信系统。尽管以前已经忽略了表面效应,但在评估此类设备的最终性能极限时必须考虑它们,特别是如果要使用纳米级MSM光电探测器。进行了一项对照研究,在该研究中,高质量器件在已知范围内遭受了表面损坏,并且观察到了光学和高频性能的最终影响,并将其与损坏相关联。

著录项

  • 作者

    McAdoo, James Alexander.;

  • 作者单位

    The College of William and Mary.;

  • 授予单位 The College of William and Mary.;
  • 学科 Engineering Electronics and Electrical.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2000
  • 页码 141 p.
  • 总页数 141
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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