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Experimental investigation of the epitaxial lateral overgrowth of gallium nitride and simulation of the gallium nitride metalorganic chemical vapor deposition process.

机译:氮化镓的外延横向过长的实验研究和氮化镓金属有机化学气相沉积过程的模拟。

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摘要

In this dissertation, the experimental investigation of the epitaxial lateral overgrowth of GaN and the simulation of the GaN MOCVD process are presented.; The effects of various parameters on the MOCVD and ELO process were examined. The crystal structures of both the GaN seeding layers and the ELO layers were examined by XRD &thetas;-2&thetas; scan and x-raying rocking curve. Significant film morphology improvement has been achieved by the ELO process. It was found that V/III ratio has no significant effect on GaN film growth in the MOCVD process. The use of a low temperature GaN buffer layer in the ELO process gave the best quality GaN film. The AIN buffer layer was found not suitable for the second growth of GaN from the seeding layer openings.; The modeling of the GaN MOCVD process has given a deep understanding of the growth process. Kinetic model describing both gas-phase and surface reactions were used in the simulation. The effect of thermal diffusion and radiative heat transfer were also taken into account. The transport phenomena for the gas mixture in the reactor chamber were studied under different operating conditions, such as susceptor rotation speed and ammonia flow rate at inlet, in different inner tube configurations. A detailed analysis of the reactions and transport process was given. The bell-shaped inner tube configuration was predicted to give better growth rate distribution than the other two configurations. High susceptor rotation speed increases the film growth rate on the substrate, but very high susceptor rotation speed also decreases the desorption rate of the surface reaction products from the growth surface. The simulation also indicated that an optimal ammonia flow rate exists. The model was validated by experimental data, and was used to explain the observed unwanted deposits on the inner tube wall for the bell-shaped inner configuration.
机译:本文介绍了GaN外延横向过长的实验研究和GaN MOCVD工艺的仿真。检查了各种参数对MOCVD和ELO工艺的影响。 GaN籽晶层和ELO层的晶体结构都通过XRDθ-2θ进行了检查。扫描和X射线摇摆曲线。通过ELO工艺已经实现了膜形态的显着改善。发现在MOCVD工艺中,V / III比对GaN膜的生长没有显着影响。在ELO工艺中使用低温GaN缓冲层可提供最优质的GaN膜。发现AIN缓冲层不适合从籽晶层开口进行GaN的第二次生长。 GaN MOCVD工艺的模型已经对生长工艺有了深入的了解。在模拟中使用了描述气相和表面反应的动力学模型。还考虑了热扩散和辐射热传递的影响。在不同的内管配置下,在不同的操作条件下,例如基座旋转速度和入口处的氨流速,研究了反应混合物室内气体混合物的传输现象。给出了反应和运输过程的详细分析。钟形内管构型预计比其他两种构型具有更好的生长速率分布。高的基座旋转速度增加了衬底上的膜生长速率,但是非常高的基座旋转速度也降低了表面反应产物从生长表面的解吸速率。模拟还表明存在最佳氨流速。该模型已通过实验数据验证,并用于解释在钟形内部配置中在内管壁上观察到的有害沉积物。

著录项

  • 作者

    Ju, Wentao.;

  • 作者单位

    Ohio University.;

  • 授予单位 Ohio University.;
  • 学科 Engineering Chemical.
  • 学位 Ph.D.
  • 年度 2003
  • 页码 154 p.
  • 总页数 154
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化工过程(物理过程及物理化学过程);
  • 关键词

  • 入库时间 2022-08-17 11:44:40

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