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Low-power multi-threshold CMOS circuits optimization and CAD tool design.

机译:低功耗多阈值CMOS电路优化和CAD工具设计。

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摘要

As technology scales into the Deep Sub-Micron regime (DSM), standby subthreshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore, effective leakage minimization techniques are a necessity. In addition, for a true low-power solution, it needs to be integrated into the principal design environment. In this thesis, two genetic algorithms are implemented to efficiently solve the Bin-Packing (BP) and the Set-Partitioning (SP) problems in the gate-clustering MTCMOS technique. Also, two design techniques are proposed to effectively solve the sleep transistor sizing problem in MTCMOS circuits. The introduced First-Fit (FF) and Set-Covering (SC) approaches achieve a lower leakage at an order of magnitude reduction in the CPU time, compared to those of other techniques in the literature. In addition, an automatic MTCMOS design environment is devised and integrated into the Canadian Microelectronics Corporation (CMC) digital ASIC design flow.
机译:随着技术扩展到深亚微米级(DSM),待机亚阈值泄漏功率随阈值电压的降低呈指数增长。因此,有效的泄漏最小化技术是必要的。此外,对于真正的低功耗解决方案,它需要集成到主要设计环境中。本文采用两种遗传算法有效地解决了门簇MTCMOS技术中的Bin-Packing(BP)和Set-Partitioning(SP)问题。此外,提出了两种设计技术来有效解决MTCMOS电路中的睡眠晶体管尺寸问题。与文献中的其他技术相比,引入的First-Fit(FF)和Set-Covering(SC)方法在CPU时间上减少了一个数量级,从而实现了更低的泄漏。此外,还设计了一个自动MTCMOS设计环境,并将其集成到加拿大微电子公司(CMC)的数字ASIC设计流程中。

著录项

  • 作者

    Wang, Wenxin.;

  • 作者单位

    University of Guelph (Canada).;

  • 授予单位 University of Guelph (Canada).;
  • 学科 Engineering Electronics and Electrical.
  • 学位 M.Sc.
  • 年度 2004
  • 页码 121 p.
  • 总页数 121
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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