An augmented phase-leg configuration (APLC) with shoot-through immunity for insulated gate power switches.

摘要

This thesis presents a new inverter phase-leg configuration that is inherently immune to shoot-through failures, eliminating one of the most serious failure modes in the conventional phase-leg configuration. The augmented phase-leg configuration (APLC) requires a single command signal and a simplified gate drive configuration to control the phase leg operation. The APLC also provides a significant advantage of eliminating the need for introducing dead-time intervals in the control of standard inverter phase legs. Very low levels of both harmonic distortion and nonlinearity are demonstrated using this new phase-leg configuration, making it attractive for many motor drive applications including low-frequency sensorless vector control, flux estimation, and open-loop voltage control. A combination of analysis, simulation, and experimental tests are presented to confirm the scalability of the APLC to current levels of 100A or higher. The importance of minimizing key parasitic inductances is investigated, and a set of physical layout design guidelines is presented to assist in the development of new APLC implementations. The net reduction of the phase-leg efficiency caused by the series diode is found to be small (1%) for bus voltages above 100Vdc. An alternative APLC topology is presented using a synchronous rectifier MOSFET that offers reduced losses by decreasing the forward conduction drop of the series diode. A self-boot charge pump for the high-side gate drive power supply is introduced to eliminate the necessity of transformers for an integrated power module design. This self-boost power supply configuration is compatible with the APLC and further enhances its robustness for operation over the complete range of PWM duty cycle values. The results of this thesis provide valuable techniques and tools for developing new integrated power electronic modules (IPEMs) that are highly integrated, intelligent, and robust.