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Statistical approach to the elastic property extraction and planar elastic response of polycrystalline thin-films.

机译:多晶薄膜的弹性特性提取和平面弹性响应的统计方法。

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摘要

A system of numerical methods is proposed to predict planar elastic responses and/or the elastic property (modulus and Poisson's ratio) of polycrystalline thin-films for Micro-Electro-Mechanical Systems (MEMS) components. A lattice based stochastic model is employed to model the micro structural evolution (nucleation and growth) of thin-film deposition. Given a micrograph, depicting a grain distribution, key kinetics parameters for the deposition process can be extracted by the proposed inverse method within the system.; In order to connect the microstructure evolution simulation and the elastic behavior prediction by the finite element method, a mesh generation algorithm on the lattice based microstructure is developed. The edge matching, essential for the node location on the grain boundaries, is accomplished by a pixel-by-pixel marching scheme. The finite element method with planar anisotropic elasticity model is used to calculate statistically averaged values of Young's modulus and Poisson's ratio. The Chi-square test is adopted for the statistical convergence criterion, proven to be statistically admissible and logically reasonable. This criterion is not affected by the appearance order of the variables and well behaved regardless of the variable types considered.; The developed system of models (plane stress/strain), techniques and numerical algorithms are applied to the following polycrystalline materials to calculate statistically scattered effective elastic constants: polysilicon, barium titanate and zircon.; A micro-beam specimen is also analyzed for a statistically scattered elastic response (tip deflection and stress) and compared with classical solutions. The beam is assumed to have a known microstructure (Al2O3 ), in which each grain has a different planar orthotropic axis. The example approach can be applied directly to other MEMS components without bothering to determine statistically averaged elastic constants.; The effects of the polycrystalline specimen size and the anisotropy of the material on the statistical scatter of the effective elastic constants are studied. The larger scatter is observed for a smaller size of specimen and for a material with more severe anisotropy.
机译:提出了一种数值方法系统来预测微机电系统(MEMS)组件的多晶薄膜的平面弹性响应和/或弹性特性(模量和泊松比)。基于晶格的随机模型用于模拟薄膜沉积的微观结构演变(成核和生长)。给定一张描述晶粒分布的显微照片,可以通过系统中提出的逆方法提取沉积过程的关键动力学参数。为了将有限元方法的微观结构演化仿真与弹性行为预测联系起来,开发了基于晶格的微观结构的网格生成算法。边缘匹配对于节点在晶粒边界上的定位至关重要,是通过逐像素行进方案实现的。采用平面各向异性弹性模型的有限元方法计算杨氏模量和泊松比的统计平均值。统计收敛标准采用卡方检验,证明其在统计上是可接受的,并且在逻辑上是合理的。该标准不受变量出现顺序的影响,并且不管所考虑的变量类型如何,其行为均良好。已开发的模型系统(平面应力/应变),技术和数值算法被用于以下多晶材料,以计算统计上分散的有效弹性常数:多晶硅,钛酸钡和锆石。还对微束样本进行了统计上分散的弹性响应(尖端变形和应力)分析,并与经典解决方案进行了比较。假定该光束具有已知的微结构(Al2O3),其中每个晶粒均具有不同的平面正交各向异性轴。该示例方法可以直接应用于其他MEMS组件,而无需费心确定统计平均弹性常数。研究了多晶试样尺寸和材料各向异性对有效弹性常数的统计散度的影响。对于较小尺寸的样品以及具有更严重各向异性的材料,观察到较大的散射。

著录项

  • 作者

    Choi, Jaehwan.;

  • 作者单位

    The Ohio State University.;

  • 授予单位 The Ohio State University.;
  • 学科 Engineering Mechanical.; Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 172 p.
  • 总页数 172
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 机械、仪表工业;
  • 关键词

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