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MBE growth and spin injection measurements of ferromagnetic alloy nickel-manganese-indium on III-V semiconductors.

机译:III-V半导体上铁磁合金镍-锰-铟的MBE生长和自旋注入测量。

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摘要

In this thesis, ferromagnetic metal/III-V semiconductor heterostructures were investigated for the development of spintronic devices. Particularly, three major research projects were carried out. First, spin injection from Fe into GaAs was studied. Second, the InAs-based resonant tunnel diode (RTD) was developed for spin detection. Third, epitaxial growth of single-crystal ferromagnetic Ni2MnIn thin films as a potential spin contact on InAs was demonstrated by molecular beam epitaxy (MBE).; Spin injection from Fe into GaAs was studied by using the Fe/(Al,Ga)As Schottky contact as the spin injector and the GaAs/(Al,Ga)As quantum well as the spin detector. Our results show that high delta-layer doping levels are detrimental to the electroluminescence polarization (ELP) signals while a uniformly doped n+-layer can improve the spin injection efficiency. An ELP signal as high as 20% was obtained for a spin light emitting diode sample with a uniformly doped n+-layer with a doping level of 5 x 1018/cm3.; The InAs/AlSb/GaSb/AlSb/GaSb/InAs RTD structure was developed as a potential spin detector. MBE growth procedures for InAs and AlxGa1-x Sb were established. InAs/AlSb/GaSb/AlSb/InAs RTD structures were grown and fabricated. The I-V characteristics of the devices show a peak-to-valley ratio of 3 and 10 at room temperature and 14 K, respectively.; As a promising spin contact on InAs, the growth of ferromagnetic Ni 2MnIn thin films on InAs (001) was demonstrated by MBE. At a growth temperature of 120°C, a transmission electron microscopy study confirms the epitaxial growth of Ni2MnIn films in the B2 structure on InAs (001). The epitaxial relationship was determined to be Ni2MnIn(001)100> || InAs(001)100>. The lower Curie temperature of the films (∼170 K), compared to that of bulk Ni2MnIn, is believed to result from the growth of Ni2MnIn in the B2 structure rather than the L21 structure. Curie temperatures of the Ni2MnIn thin films can be increased through annealing. For a sample grown at 120°C and annealed at 200°C, a Curie temperature as high as 330 K was obtained. The high Curie temperature is correlated to the Ni2MnIn in the partially L21-ordered structure.
机译:本文针对自旋电子器件的发展,研究了铁磁性金属/ III-V族半导体异质结构。特别是,进行了三个重大研究项目。首先,研究了从Fe到GaAs的自旋注入。其次,开发了基于InAs的谐振隧道二极管(RTD)用于自旋检测。第三,通过分子束外延(MBE)证明了单晶铁磁Ni2MnIn薄膜的外延生长作为InAs上的潜在自旋接触。以Fe /(Al,Ga)As肖特基接触为自旋注入器,以GaAs /(Al,Ga)As量子阱为自旋探测器,研究了Fe自旋注入GaAs的过程。我们的结果表明,高增量层掺杂水平对电致发光偏振(ELP)信号有害,而均匀掺杂的n +层可以提高自旋注入效率。对于具有均匀掺杂的n +层,掺杂水平为5 x 1018 / cm3的自旋发光二极管样品,获得了高达20%的ELP信号。开发了InAs / AlSb / GaSb / AlSb / GaSb / InAs RTD结构作为潜在的自旋探测器。建立了InAs和AlxGa1-x Sb的MBE生长程序。生长并制造了InAs / AlSb / GaSb / AlSb / InAs RTD结构。器件的I-V特性在室温和14 K下分别显示出峰谷比为3和10。 MBE证明了在InAs上有希望的自旋接触,在InAs(001)上的铁磁Ni 2MnIn薄膜的生长。在120°C的生长温度下,透射电子显微镜研究证实了In2(001)上B2结构中Ni2MnIn薄膜的外延生长。确定外延关系为Ni 2 MnIn(001)100 ||。 InAs(001)<100>。与块状Ni2MnIn相比,薄膜的居里温度较低(约170 K),是由于Ni2MnIn在B2结构而非L21结构中的生长所致。 Ni2MnIn薄膜的居里温度可以通过退火来提高。对于在120℃下生长并在200℃下退火的样品,获得了高达330K的居里温度。居里温度高与部分L21有序结构中的Ni2MnIn相关。

著录项

  • 作者

    Xie, Junqing.;

  • 作者单位

    University of Minnesota.;

  • 授予单位 University of Minnesota.;
  • 学科 Engineering Materials Science.; Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 134 p.
  • 总页数 134
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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