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Role of transition metal impurities on the functional properties of dilute magnetic nitride semiconductors and high-performance microwave oxide dielectrics.

机译:过渡金属杂质对稀磁性氮化物半导体和高性能微波氧化物电介质的功能特性的作用。

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摘要

The thesis investigates transition metal doping in two types of materials: wide bandgap semiconductors for spintronic applications and oxide dielectrics for microwave applications.; MBE grown Cr-doped GaN has been found to exhibit ferromagnetism at over 900 K. The measured magnetic moment per Cr atom in Cr-doped GaN varied significantly as a function of Cr concentration, with a maximum magnetic moment occurring at 3% Cr. Transport measurements of Cr-doped GaN revealed properties characteristic of hopping conduction. These measurements also inferred that the carrier concentration is similar in magnitude to the measured concentration of magnetically active Cr. This fits well into the scenario that electrons at the partially filled Cr t2 level contribute to the hopping conduction. These results, along with extensive structural characterization, suggest that ferromagnetism in Cr-doped GaN best fits the double exchange like mechanism as a result of hopping between near-midgap substitutional Cr impurity band.; Exchange biasing effects were observed in sample structures of Cr-doped GaN thin films with an antiferromagnetic MnO overlayer. The center of the magnetic hysteresis loop shifts to negative magnetic field by ∼70 Oe when measured after field cooling. Enhancement of the coercive field of the Cr-doped GaN film is also found. The mechanism responsible for the exchange bias is attributed to the exchange coupling at the ferromagnetic Cr-doped GaN/antiferromagnetic MnO interface. The observed exchange biasing indicates that Cr-doped GaN has properties of a conventional ferromagnet and has potential use in practical magnetoelectronic devices.; The effect of Ni-doping on the structural, dielectric and optical properties of Ba(Cd1/3Ta2/3)O3 (BCT) dielectrics has been explored. Rietveld analysis of the X-ray diffraction (XRD) data indicates that the BCT structure is similar to other Ba(B'1/3B" 2/3)O3 perovskites, although the Ta-O-Cd is distorted to an angle of ∼173°; very close to the earlier theoretical prediction of 172°. The XRD analysis also indicates that Ni doping significantly enhances the extent of Cd-Ta ordering in BCT. The temperature coefficient of resonant frequency decreases with Ni concentration up to 2 wt%. While the loss tangent of BCT is reduced at small levels of Ni doping (up to 0.5 wt%), it increases abruptly at higher concentrations. A correlation exists between the loss tangent of Ni-doped BCT samples and the intensity of a continuous absorption background in the optical spectra. This optical activity results from the presence of optically active point defects and is suggestive that these defects play an important role in the microwave loss in BCT dielectrics.
机译:本文研究了两种材料中的过渡金属掺杂:用于自旋电子学的宽带隙半导体和用于微波的氧化物电介质。已发现MBE生长的Cr掺杂的GaN在900 K以上具有铁磁性。在Cr掺杂的GaN中,每个Cr原子测得的磁矩随Cr浓度的变化而显着变化,最大磁矩出现在3%Cr处。 Cr掺杂的GaN的传输测量显示出跳跃传导的特性。这些测量结果还推断出载流子浓度在大小上与测得的磁活性Cr浓度相似。这非常适合以下情况:部分填充的Cr t2能级的电子有助于跳跃传导。这些结果以及广泛的结构表征表明,由于在近中能隙的Cr杂质带之间跳跃,Cr掺杂的GaN中的铁磁性最适合双交换机制。在具有反铁磁MnO覆盖层的Cr掺杂GaN薄膜的样品结构中观察到交换偏压效应。在磁场冷却后进行测量时,磁滞回线的中心向负磁场偏移了约70 Oe。还发现了掺杂Cr的GaN膜的矫顽场的增强。引起交换偏压的机制归因于在铁磁Cr掺杂的GaN /反铁磁MnO界面处的交换耦合。观察到的交换偏压表明,掺Cr的GaN具有常规铁磁体的性能,并在实际的磁电子器件中具有潜在的用途。研究了镍掺杂对Ba(Cd1 / 3Ta2 / 3)O3(BCT)电介质的结构,介电性能和光学性能的影响。对X射线衍射(XRD)数据的Rietveld分析表明,尽管Ta-O-Cd畸变到〜的角度,但BCT结构类似于其他Ba(B'1 / 3B“ 2/3)O3钙钛矿。 173°;非常接近先前的172°的理论预测; X射线衍射分析还表明,Ni掺杂显着提高了BCT中Cd-Ta有序程度,当Ni浓度达到2 wt%时,共振频率的温度系数降低。当少量的镍掺杂(至多0.5 wt%)时,BCT的损耗角正切减小,而在较高的浓度下,BCT的损耗角正切增加,掺杂Ni的BCT样品的损耗角正切与连续吸收背景的强度之间存在相关性。这种光学活性是由于存在光学活性点缺陷而引起的,表明这些缺陷在BCT电介质的微波损耗中起着重要作用。

著录项

  • 作者

    Liu, Hongxue.;

  • 作者单位

    Arizona State University.;

  • 授予单位 Arizona State University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 97 p.
  • 总页数 97
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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