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Growth of zinc oxide nanostructures using chemical methods.

机译:使用化学方法生长氧化锌纳米结构。

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摘要

Zinc oxide is a group II--VI n-type semiconductor with a band gap of approximately 3.3--3.6 eV. The purpose of this research was to deposit and grow ZnO nanorod structures on suitable substrates. Two deposition methods, electrodeposition and wet chemistry, were investigated. In both methods, variables such as solution concentration, deposition time, temperature and substrate were changed so that the optimal recipe could be realized. Analysis was completed by using scanning electron microscopy (SEM) and symmetric x-ray diffraction (XRD) to determine the structure and morphology of the surface. Both deposition methods allowed for the growth of ZnO. Electrodeposition resulted in hexagonal ZnO platelet structures, ranging in 1000--3000 nm in diameter on Au substrates. Variation in growth times from 20--70 minutes did not effect growth; the potential -0.6V SCE resulted in poor growth, but potential ≥ -0.7V/SCE resulted in good growth. The growth appeared to be caused by the electric field concentration of the platelet's edges. Using wet chemistry, optimal growth was found on a Ag substrate, which produced ZnO nanorods approximately 200 nm in diameter and less than 1 mum in length growing along the (0001) plane.
机译:氧化锌是一种II-VI n型半导体,带隙约为3.3--3.6 eV。这项研究的目的是在合适的基底上沉积和生长ZnO纳米棒结构。研究了两种沉积方法,电沉积法和湿化学法。在这两种方法中,都更改了诸如溶液浓度,沉积时间,温度和底物之类的变量,从而可以实现最佳配方。通过使用扫描电子显微镜(SEM)和对称X射线衍射(XRD)完成分析以确定表面的结构和形态。两种沉积方法都允许ZnO的生长。电沉积导致六方形ZnO血小板结构,在Au基底上直径范围为1000--3000 nm。从20--70分钟的生长时间变化不会影响生长;电位-0.6V SCE导致生长不良,但电位≥-0.7V / SCE导致生长良好。增长似乎是由血小板边缘的电场集中引起的。使用湿化学法,发现在Ag衬底上具有最佳生长,该衬底产生的ZnO纳米棒的直径约为200 nm,长度小于(1 mum)沿(0001)平面生长。

著录项

  • 作者

    Denny, Tiffany L.;

  • 作者单位

    University of Delaware.;

  • 授予单位 University of Delaware.;
  • 学科 Engineering Electronics and Electrical.; Engineering Materials Science.
  • 学位 M.E.E.
  • 年度 2006
  • 页码 60 p.
  • 总页数 60
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;工程材料学;
  • 关键词

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