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Ultra Precision Visual Servo Control of Micro Objects

机译:微型物体的超精密视觉伺服控制

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摘要

There is a constant demand for increasingly accurate and reliable precision motion control in advanced instrumentation and manufacturing processes requiring the highest precision. At precision levels of nanometer and beyond, precise positioning and/or alignment of micro objects in 3D space can be a daunting task prone to many sources of error. Better solutions to this problem can benefit areas such as photonic alignment, micro/nano assembly and nano instrumentation.;State-of-the-art motion stages can achieve motion resolution at sub-nanometer levels; however, due to non-linearity and/or sensor drift, maneuvering the stage with that level of accuracy throughout the entire workspace of the stage is extremely difficult if not impossible. A robust solution is to employ direct metrology which acquires real-time feedback from the object space of the application, enabling direct servo control which continuously compensates for time varying error sources. Visual feedback, employed to achieve direct metrology, can provide global information, which defines a common reference frame in the object space with respect to which multiple objects are registered, revealing the relative position and orientation among objects that are subject to positioning, alignment, and engagement.;The object of this thesis is to analyze the various aspects of and provide novel solutions to the task of achieving direct metrology and visual servo control applied to nanometer-scale motion control. A novel measurement technique is developed which enables six-degree-of-freedom motion measurement with nanometer precision. This measurement technology is integrated into a motion control scheme which performs positioning and alignment of micro objects throughout a 3D volume. Furthermore, a novel theoretical analysis of measurement bias in image-based motion estimation is developed which enables a bias compensation scheme. Finally, analysis of the sampling and exposure mechanism in the video capturing process to formulate a novel solution for the aliasing problem in visual motion sensors is presented.
机译:在要求最高精确度的先进仪器和制造过程中,对不断提高的精确度和可靠性的精确运动控制有持续的需求。在纳米级甚至更高的精度水平上,微对象在3D空间中的精确定位和/或对齐可能是一项艰巨的任务,容易产生许多错误源。更好的解决方案可以使诸如光子对准,微米/纳米组装和纳米仪器等领域受益。先进的运动平台可以实现亚纳米级的运动分辨率;但是,由于非线性和/或传感器漂移,即使不是不可能,在平台的整个工作空间内以这种精度操纵平台也是极其困难的。可靠的解决方案是采用直接计量技术,该技术可从应用程序的对象空间获取实时反馈,从而实现直接伺服控制,从而连续补偿时变误差源。用于实现直接计量的视觉反馈可以提供全局信息,该信息定义了对象空间中相对于多个对象相对于其对齐的公共参考框架,从而揭示了对象之间的相对位置和方向,这些对象之间的相对位置和方向需要进行定位,对齐和定位。本文的目的是分析纳米技术的各个方面,并为实现直接计量和视觉伺服控制应用于纳米级运动控制的任务提供新颖的解决方案。开发了一种新颖的测量技术,该技术可实现纳米精度的六自由度运动测量。这项测量技术已集成到运动控制方案中,该方案在整个3D体积中执行微对象的定位和对齐。此外,开发了一种新颖的基于图像的运动估计中的测量偏差的理论分析,它可以实现偏差补偿方案。最后,分析了视频捕获过程中的采样和曝光机制,从而为视觉运动传感器中的混叠问题提出了一种新颖的解决方案。

著录项

  • 作者

    Kim, Jung.;

  • 作者单位

    The Ohio State University.;

  • 授予单位 The Ohio State University.;
  • 学科 Mechanical engineering.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 219 p.
  • 总页数 219
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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