首页> 外文学位 >Removal of adsorbed moisture and organics from surfaces and nanostructures in semiconductor manufacturing.
【24h】

Removal of adsorbed moisture and organics from surfaces and nanostructures in semiconductor manufacturing.

机译:在半导体制造中从表面和纳米结构中去除吸附的水分和有机物。

获取原文
获取原文并翻译 | 示例

摘要

As the semiconductor industry is moving towards achieving smaller, denser and faster integrated circuits; the issue of contamination control is becoming increasingly important. The current work focuses on the mechanism and kinetics of removal of adsorbed moisture and organics from surfaces and nanostructures.;In the first application of this study, a novel approach to the characterization of dynamic interactions of gases with solid surfaces is developed. A model is developed to represent the simultaneous adsorption and desorption processes in these systems. The model can simulate both the non-equilibrium adsorption and desorption processes as well as the equilibrium state (isotherms and isobars). The model is validated using experimental data, and applied to the adsorption of moisture on oxides (ZrO2 and HfO2). Practical application of this work is shown by optimizing the purge recipes for removal of moisture from a ZrO2 film.;In the second application, a novel approach is developed and demonstrated to characterize the sampling line effects during dynamic monitoring of fluid concentrations. The "Sampling line" in this study refers to all components between the point of fluid sampling and the point of analyzer sensor. In general, sampling lines introduce errors in measurements by altering the sample properties due to the fluid transport in the line as well as the adsorption and desorption of fluid constituents on the surfaces of the sampling components that come in contact with the sample fluid. A methodology based on a sampling line simulator is developed for taking these effects into account and correcting the measurements. The sampling line simulator can be used to analyze the effect of various sampling configurations and operating conditions.;In the last application, experiments were carried out to study the interaction of organics with micro/nano particles representing nanostructures. A process model is developed which gives insight about the mechanism and kinetics of these interactions. The micro/nano particles, due to their large surface area, can adsorb any other species which may result in the change in their properties. This may ultimately affect the process in which they exist. This study will also be helpful in analyzing the Environment, Safety and Health (ESH) effects of nanostructures.
机译:随着半导体工业正在朝着实现更小,更密集和更快的集成电路发展;污染控制的问题变得越来越重要。目前的工作重点是从表面和纳米结构中去除吸附的水分和有机物的机理和动力学。在本研究的第一个应用中,开发了表征气体与固体表面动态相互作用的新方法。开发了一个模型来表示这些系统中同时进行的吸附和解吸过程。该模型可以模拟非平衡吸附和解吸过程以及平衡状态(等温线和等压线)。该模型已使用实验数据进行了验证,并应用于水分在氧化物(ZrO2和HfO2)上的吸附。通过优化清除ZrO2膜中水分的清除方法,可以显示这项工作的实际应用。在第二项应用中,开发了一种新颖的方法,并演示了在动态监测流体浓度期间表征采样管线效应的方法。本研究中的“采样线”是指流体采样点与分析仪传感器点之间的所有组件。通常,由于管线中的流体传输以及与采样流体接触的采样组件表面上流体成分的吸附和解吸附,采样管线会通过改变样品特性而在测量中引入误差。开发了一种基于采样线模拟器的方法,以考虑这些影响并校正测量结果。采样线模拟器可用于分析各种采样配置和操作条件的影响。在最后一个应用中,进行了实验以研究有机物与代表纳米结构的微/纳米颗粒之间的相互作用。开发了一个过程模型,可以深入了解这些相互作用的机理和动力学。微米/纳米颗粒由于其较大的表面积而可以吸附任何其他物种,这可能导致其性质发生变化。这可能最终影响它们存在的过程。这项研究还将有助于分析纳米结构的环境,安全和健康(ESH)效应。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号