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Modelisation du transport par piegeage multiple de porteurs electroniques dans le silicium amorphe hydrogene.

机译:通过在氢化非晶硅中多次捕获电子载流子来进行传输建模。

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摘要

We study, using the Monte Carlo (MC) method, multiple trapping (MT) controlled charge transport assuming an exponential band tail in hydrogenated amorphous silicon (a-Si:H). The primary goals of this research are (i) to deepen our knowledge of the microscopic mechanisms for this type of transport and (ii) to develop a unified model able to adequately reproduce the experimental data in all temperature, field and time regimes. First, we review the physics of field assisted detrapping, particularly a high field model, developed earlier. In order to rigorously include the effects of tunneling on the release rate Kr(E), we examine the sum of contributions from all the different tunneling paths Deltax. We apply this idea to the model. We suggest the possibility that tunneling may contribute to carrier trapping. By applying the condition of detailed balance, we find that we may include the effects of tunneling on the capture rate kc(E) by properly defining the Delta x dependent release rate.; We develop a unified model based on MT transport including the Meyer-Neldel effect and field assisted detrapping. By simulating time-of-flight experiments using the MC method, we show that this new model, which includes five fixed parameters, satisfactorily reproduces the temperature and field behavior of all the empirical results. These include the pre-transit dispersion parameter alpha 1 and alternative definitions of the mobility mu. We observe a contradiction between drift mobility muD mesurements made by different laboratories. The data suggests that this inconsistency is due to differences between the samples or to inherent difficulties associated with high field measurements.; We find that our model is able, with a slight modification of the optimal parameters found previously, to reproduce the experimental data measured at all times longer than one picosecond. This shows that MT controlled transport is dominant at short (t ∼ 1 ps) and long (t > 1 ns) times. We also show that picosecond domain data are compatible with the traditional nanosecond domain data. Our calculations suggest that trap-free transport could be experimentally observable with an improvement in time resolution of one order of magnitude. Our model is the first, to our knowledge, to produce predictions in agreement with the experimental results for all temperature, field and time regimes studied to date.
机译:我们使用蒙特卡洛(MC)方法研究多重陷阱(MT)控制的电荷传输,假设氢化非晶硅(a-Si:H)中存在指数带尾。这项研究的主要目标是(i)加深我们对于这种运输的微观机制的认识,以及(ii)开发能够在所有温度,场和时间范围内充分再现实验数据的统一模型。首先,我们回顾了早期开发的场辅助去陷阱的物理原理,特别是高场模型。为了严格包括隧穿对释放速率Kr(E)的影响,我们检查了来自所有不同隧穿路径Deltax的贡献之和。我们将此想法应用于模型。我们建议隧道效应可能有助于载流子捕获。通过应用详细平衡的条件,我们发现可以通过适当定义Delta x依赖释放速率来包括隧穿对捕获速率kc(E)的影响。我们基于MT传输开发了一个统一的模型,包括Meyer-Neldel效应和现场辅助去陷。通过使用MC方法模拟飞行时间实验,我们证明了这个包含五个固定参数的新模型可以令人满意地重现所有经验结果的温度和场行为。这些包括运输前色散参数α1和迁移率μ的替代定义。我们观察到由不同实验室进行的漂移淌度muD测量之间的矛盾。数据表明这种不一致是由于样品之间的差异或与高场测量相关的固有困难。我们发现,通过对先前找到的最佳参数稍加修改,我们的模型能够重现所有时间都超过1皮秒的实验数据。这表明MT控制的运输在短时间(t〜1 ps)和长时间(t> 1 ns)时占主导地位。我们还表明,皮秒域数据与传统的纳秒域数据兼容。我们的计算表明,无陷阱运输可以通过实验观察到,时间分辨率提高一个数量级。据我们所知,我们的模型是第一个根据迄今为止研究的所有温度,场和时间范围的实验结果得出预测的模型。

著录项

  • 作者

    Maassen, Jesse.;

  • 作者单位

    Ecole Polytechnique, Montreal (Canada).;

  • 授予单位 Ecole Polytechnique, Montreal (Canada).;
  • 学科 Physics Condensed Matter.
  • 学位 M.Sc.A.
  • 年度 2007
  • 页码 86 p.
  • 总页数 86
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 O49;
  • 关键词

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