PATEGE: An Automatic DC Parametric Test Generation System for Series Gated ECL Circuits

摘要

For ECL circuits, DC parametric tests such as input current (IIL, IIH), reference voltage (VBB), and power supply current (ICC) tests are executed as well as functional tests. This paper describes an automatic DC parametric test generation system PATEGE for the series gated ECL circuits. PATEGE can automatically generate the test patterns and calculate the expected values for IIL, IIH, VBB and ICC tests.